Browsing by Author Dupres, Vincent

Showing results 1 to 7 of 7
Issue DateTitleAuthor(s)
2012Atomic force microscopy - looking at mechanosensors on the cell surfaceHeinisch, Juergen J.; Lipke, Peter N.; Beaussart, Audrey; Chatel, Sofiane El Kirat; Dupres, Vincent; Alsteens, David; Dufrene, Yves F.
2011Atomic Force Microscopy Demonstrates That Disulfide Bridges Are Required for Clustering of the Yeast Cell Wall Integrity Sensor Wsc1Dupres, Vincent; Heinisch, Jurgen J.; Dufrene, Yves F.
2012High-Resolution Imaging of Chemical and Biological Sites on Living Cells Using Peak Force Tapping Atomic Force MicroscopyAlsteens, David; Dupres, Vincent; Yunus, Sami; Latge, Jean-Paul; Heinisch, Juergen J.; Dufrene, Yves F.
2010Measurement of the mechanical behavior of yeast membrane sensors using single-molecule atomic force microscopyHeinisch, Juergen J.; Dupres, Vincent; Alsteens, David; Dufrene, Yves F.
2010Measuring Cell Wall Thickness in Living Yeast Cells Using Single Molecular RulersDupres, Vincent; Dufrene, Yves F.; Heinisch, Juergen J.
2010Single-Molecule Atomic Force Microscopy Reveals Clustering of the Yeast Plasma-Membrane Sensor Wsc1Heinisch, Juergen J.; Dupres, Vincent; Wilk, Sabrina; Jendretzki, Arne; Dufrene, Yves F.
2009The yeast Wsc1 cell surface sensor behaves like a nanospring in vivoDupres, Vincent; Alsteens, David; Wilk, Sabrina; Hansen, Benjamin; Heinisch, Juergen J.; Dufrene, Yves F.