XE-ADLAYERS ON PT(111) AND PD(111) - STRUCTURE INVESTIGATION BY SPIN-POLARIZED LEED

Abstract

(square-root 3 x square-root 3)R30-degrees Xe-layers on Pt(111) and Pd(111) are studied by spin-polarized LEED. In the experiment spin-polarized electrons from a GaAs photoemission source were scattered and the spin-dependent intensities are measured in different diffracted beams. Corresponding calculations were performed using a new relativistic LEED code. Measurements and calculations agree reasonably. They show strong contributions from multiple scattering between substrate and adlayer, and therefore spin-polarized LEED reveals strong sensitivity to structural parameters.