EXPERIMENTAL-DETERMINATION OF PLASMON ENERGIES FROM X-RAY EXCITED SELENIUM AUGER PEAKS IN GE-IN-SE CHALCOGENIDE GLASSES

Abstract

The values of the plasmon energies generated by X-ray excited Auger electrons from the L(3)M(4,5)M(4,5) lines from selenium, in GexIn6Se94-x and GexIn12Se88-x families of the Ge-In-Se glassy system, have been measured. In the variation of the plasmon energy as a function of selenium content in the glass, it is found that there is a marked reduction of the value of the plasmon energy as the amount of selenium content is reduced. This reduction in the value of the plasmon energy is used to support the view that the local electron density about selenium atoms in the glass decreases with the decrease of selenium content in the glass.