X-ray photoelectron spectroscopic study of composite glass fillers

Autor(en): Simon, V.
Colceriu, A.
Prejmerean, C.
Moldovan, M.
Prinz, M.
Neumann, M.
Stichwörter: composites; dental fillers; Materials Science; Materials Science, Multidisciplinary; Optics; Physics; Physics, Applied; XPS
Erscheinungsdatum: 2007
Herausgeber: NATL INST OPTOELECTRONICS
Journal: JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS
Volumen: 9
Ausgabe: 11
Startseite: 3350
Seitenende: 3353
Zusammenfassung: 
Modern dental practice has become very dependent on its materials, such that a great challenge in restorative stomatology is choosing the right combinations of materials. Dental composites consisting of a polymerisable matrix and glass filler particles attracted a large interest. In this study are investigated by X-ray Photoelectron Spectroscopy (XPS) four composite materials obtained from about 1/4 organic phase and 314 inorganic phase in form of oxide glass powder. C 1s core level spectra were analysed in order to get information on functional groups. The 0 1s core level peaks for all samples show that the environments around the oxygen atoms are similar and according to binding energy values they denote non-bridging oxygens in the investigated composites.
Beschreibung: 
2nd International Conference on Biomaterials and Medical Devices, Iasi, ROMANIA, NOV 09-10, 2006
ISSN: 14544164

Show full item record

Page view(s)

3
Last Week
0
Last month
0
checked on Mar 3, 2024

Google ScholarTM

Check