X-ray photoelectron spectroscopic study of composite glass fillers
Autor(en): | Simon, V. Colceriu, A. Prejmerean, C. Moldovan, M. Prinz, M. Neumann, M. |
Stichwörter: | composites; dental fillers; Materials Science; Materials Science, Multidisciplinary; Optics; Physics; Physics, Applied; XPS | Erscheinungsdatum: | 2007 | Herausgeber: | NATL INST OPTOELECTRONICS | Journal: | JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS | Volumen: | 9 | Ausgabe: | 11 | Startseite: | 3350 | Seitenende: | 3353 | Zusammenfassung: | Modern dental practice has become very dependent on its materials, such that a great challenge in restorative stomatology is choosing the right combinations of materials. Dental composites consisting of a polymerisable matrix and glass filler particles attracted a large interest. In this study are investigated by X-ray Photoelectron Spectroscopy (XPS) four composite materials obtained from about 1/4 organic phase and 314 inorganic phase in form of oxide glass powder. C 1s core level spectra were analysed in order to get information on functional groups. The 0 1s core level peaks for all samples show that the environments around the oxygen atoms are similar and according to binding energy values they denote non-bridging oxygens in the investigated composites. |
Beschreibung: | 2nd International Conference on Biomaterials and Medical Devices, Iasi, ROMANIA, NOV 09-10, 2006 |
ISSN: | 14544164 |
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