Structure and morphology of epitaxially grown Fe3O4/NiO bilayers on MgO(001)

DC FieldValueLanguage
dc.contributor.authorSchemme, T.
dc.contributor.authorKuschel, O.
dc.contributor.authorBertram, F.
dc.contributor.authorKuepper, K.
dc.contributor.authorWollschlaeger, J.
dc.date.accessioned2021-12-23T16:13:05Z-
dc.date.available2021-12-23T16:13:05Z-
dc.date.issued2015
dc.identifier.issn00406090
dc.identifier.urihttps://osnascholar.ub.uni-osnabrueck.de/handle/unios/10398-
dc.description.abstractCrystalline Fe3O4/NiO bilayers were grown on MgO(001) substrates using reactive molecular beam epitaxy to investigate their structural properties and their morphology. The film thickness either of the Fe3O4 film or of the NiO film has been varied to shed light on the relaxation of the bilayer system. The surface properties as studied by X-ray photoelectron spectroscopy and low energy electron diffraction show clear evidence of stoichiometric well-ordered film surfaces. Based on the kinematic approach X-ray diffraction experiments were completely analyzed. As a result the NiO films grow pseudomorphic in the investigated thickness range (up to 34 nm) while the Fe3O4 films relax continuously up to the thickness of 50 nm. Although all diffraction data show well developed Laue fringes pointing to oxide films of very homogeneous thickness, the Fe3O4/NiO interface roughens continuously up to 1 nm root-mean-square roughness with increasing NiO film thickness while the Fe3O4 surface is very smooth independent on the Fe3O4 film thickness. Finally, the Fe3O4/NiO interface spacing is similar to the interlayer spacing of the oxide films while the NiO/MgO interface is expanded. (C) 2015 Elsevier B.V. All rights reserved.
dc.description.sponsorshipDFGGerman Research Foundation (DFG)European Commission [KU2321/2-1]; Parts of this research were carried out at the light source PETRA III at DESY, a member of the Helmholtz Association (HGF). We would like to thank O. H. Seeck for assistance using beamline P08. Financial support by the DFG (KU2321/2-1) is gratefully acknowledged.
dc.language.isoen
dc.publisherELSEVIER SCIENCE SA
dc.relation.ispartofTHIN SOLID FILMS
dc.subjectBilayer epitaxy
dc.subjectFILMS
dc.subjectInterface structure
dc.subjectMagnesium oxide
dc.subjectMagnetite
dc.subjectMaterials Science
dc.subjectMaterials Science, Coatings & Films
dc.subjectMaterials Science, Multidisciplinary
dc.subjectNickel oxide
dc.subjectPhysics
dc.subjectPhysics, Applied
dc.subjectPhysics, Condensed Matter
dc.subjectRELAXATION
dc.subjectThin film structure
dc.subjectX-ray diffraction
dc.subjectXPS SPECTRA
dc.titleStructure and morphology of epitaxially grown Fe3O4/NiO bilayers on MgO(001)
dc.typejournal article
dc.identifier.doi10.1016/j.tsf.2015.06.018
dc.identifier.isiISI:000360320000085
dc.description.volume589
dc.description.startpage526
dc.description.endpage533
dc.contributor.orcid0000-0001-9002-4118
dc.contributor.researcheridG-1397-2016
dc.identifier.eissn18792731
dc.publisher.placePO BOX 564, 1001 LAUSANNE, SWITZERLAND
dcterms.isPartOf.abbreviationThin Solid Films
dcterms.oaStatusGreen Submitted
crisitem.author.deptFB 04 - Physik-
crisitem.author.deptUniversität Osnabrück-
crisitem.author.deptidfb04-
crisitem.author.orcid0000-0001-9002-4118-
crisitem.author.parentorgUniversität Osnabrück-
crisitem.author.netidScTo645-
crisitem.author.netidBeFl001-
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