Structure and morphology of epitaxially grown Fe3O4/NiO bilayers on MgO(001)
DC Element | Wert | Sprache |
---|---|---|
dc.contributor.author | Schemme, T. | |
dc.contributor.author | Kuschel, O. | |
dc.contributor.author | Bertram, F. | |
dc.contributor.author | Kuepper, K. | |
dc.contributor.author | Wollschlaeger, J. | |
dc.date.accessioned | 2021-12-23T16:13:05Z | - |
dc.date.available | 2021-12-23T16:13:05Z | - |
dc.date.issued | 2015 | |
dc.identifier.issn | 00406090 | |
dc.identifier.uri | https://osnascholar.ub.uni-osnabrueck.de/handle/unios/10398 | - |
dc.description.abstract | Crystalline Fe3O4/NiO bilayers were grown on MgO(001) substrates using reactive molecular beam epitaxy to investigate their structural properties and their morphology. The film thickness either of the Fe3O4 film or of the NiO film has been varied to shed light on the relaxation of the bilayer system. The surface properties as studied by X-ray photoelectron spectroscopy and low energy electron diffraction show clear evidence of stoichiometric well-ordered film surfaces. Based on the kinematic approach X-ray diffraction experiments were completely analyzed. As a result the NiO films grow pseudomorphic in the investigated thickness range (up to 34 nm) while the Fe3O4 films relax continuously up to the thickness of 50 nm. Although all diffraction data show well developed Laue fringes pointing to oxide films of very homogeneous thickness, the Fe3O4/NiO interface roughens continuously up to 1 nm root-mean-square roughness with increasing NiO film thickness while the Fe3O4 surface is very smooth independent on the Fe3O4 film thickness. Finally, the Fe3O4/NiO interface spacing is similar to the interlayer spacing of the oxide films while the NiO/MgO interface is expanded. (C) 2015 Elsevier B.V. All rights reserved. | |
dc.description.sponsorship | DFGGerman Research Foundation (DFG)European Commission [KU2321/2-1]; Parts of this research were carried out at the light source PETRA III at DESY, a member of the Helmholtz Association (HGF). We would like to thank O. H. Seeck for assistance using beamline P08. Financial support by the DFG (KU2321/2-1) is gratefully acknowledged. | |
dc.language.iso | en | |
dc.publisher | ELSEVIER SCIENCE SA | |
dc.relation.ispartof | THIN SOLID FILMS | |
dc.subject | Bilayer epitaxy | |
dc.subject | FILMS | |
dc.subject | Interface structure | |
dc.subject | Magnesium oxide | |
dc.subject | Magnetite | |
dc.subject | Materials Science | |
dc.subject | Materials Science, Coatings & Films | |
dc.subject | Materials Science, Multidisciplinary | |
dc.subject | Nickel oxide | |
dc.subject | Physics | |
dc.subject | Physics, Applied | |
dc.subject | Physics, Condensed Matter | |
dc.subject | RELAXATION | |
dc.subject | Thin film structure | |
dc.subject | X-ray diffraction | |
dc.subject | XPS SPECTRA | |
dc.title | Structure and morphology of epitaxially grown Fe3O4/NiO bilayers on MgO(001) | |
dc.type | journal article | |
dc.identifier.doi | 10.1016/j.tsf.2015.06.018 | |
dc.identifier.isi | ISI:000360320000085 | |
dc.description.volume | 589 | |
dc.description.startpage | 526 | |
dc.description.endpage | 533 | |
dc.contributor.orcid | 0000-0001-9002-4118 | |
dc.contributor.researcherid | G-1397-2016 | |
dc.identifier.eissn | 18792731 | |
dc.publisher.place | PO BOX 564, 1001 LAUSANNE, SWITZERLAND | |
dcterms.isPartOf.abbreviation | Thin Solid Films | |
dcterms.oaStatus | Green Submitted | |
crisitem.author.dept | FB 04 - Physik | - |
crisitem.author.dept | Universität Osnabrück | - |
crisitem.author.deptid | fb04 | - |
crisitem.author.orcid | 0000-0001-9002-4118 | - |
crisitem.author.parentorg | Universität Osnabrück | - |
crisitem.author.netid | ScTo645 | - |
crisitem.author.netid | BeFl001 | - |
Seitenaufrufe
4
Letzte Woche
0
0
Letzter Monat
0
0
geprüft am 29.05.2024