Achieving high effective Q-factors in ultra-high vacuum dynamic force microscopy

Autor(en): Luebbe, Jannis
Troeger, Lutz
Torbruegge, Stefan
Bechstein, Ralf
Richter, Christoph
Kuehnle, Angelika
Reichling, Michael 
Stichwörter: ATOMIC SIZE DEFECTS; BEAM RESONATORS; CAF2(111); cantilever; CANTILEVERS; DISSIPATION; Engineering; Engineering, Multidisciplinary; force microscopy; GEOMETRY; Instruments & Instrumentation; mounting loss; NC-AFM; PRESSURE; Q-factor; SURFACE
Erscheinungsdatum: 2010
Herausgeber: IOP PUBLISHING LTD
Journal: MEASUREMENT SCIENCE AND TECHNOLOGY
Volumen: 21
Ausgabe: 12
Zusammenfassung: 
The effective Q-factor of the cantilever is one of the most important figures-of-merit for a non-contact atomic force microscope (NC-AFM) operated in ultra-high vacuum (UHV). We provide a comprehensive discussion of all effects influencing the Q-factor and compare measured Q-factors to results from simulations based on the dimensions of the cantilevers. We introduce a methodology to investigate in detail how the effective Q-factor depends on the fixation technique of the cantilever. Fixation loss is identified as a most important contribution in addition to the hitherto discussed effects and we describe a strategy for avoiding fixation loss and obtaining high effective Q-factors in the force microscope. We demonstrate for room temperature operation, that an optimum fixation yields an effective Q-factor for the NC-AFM measurement in UHV that is equal to the intrinsic value of the cantilever.
ISSN: 09570233
DOI: 10.1088/0957-0233/21/12/125501

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