Anisotropy of the dielectric permittivity of Sn2P2S6 measured with light-induced grating techniques

DC FieldValueLanguage
dc.contributor.authorShumelyuk, A
dc.contributor.authorBarilov, D
dc.contributor.authorOdoulov, S
dc.contributor.authorKratzig, E
dc.date.accessioned2021-12-23T16:13:38Z-
dc.date.available2021-12-23T16:13:38Z-
dc.date.issued2003
dc.identifier.issn09462171
dc.identifier.urihttps://osnascholar.ub.uni-osnabrueck.de/handle/unios/10668-
dc.description.abstractWe apply, for the first time to our knowledge, photorefractive grating spectroscopy to obtain not-yet-known data on the anisotropy of the dielectric permittivity of Sn2P2S6. Two independent techniques are used, one based on measurements of the amplitude of the space-charge field grating as a function of grating spacing and the other based on measurements of the grating decay time, also as a function of grating spacing. Both techniques provide close values for the anisotropy, which appears to be well pronounced, a ratio epsilon(xx)/epsilon(zz) approximate to 4 is revealed for two of the three independent components of the dielectric tensor. Our data also allow us to conclude that the charge mobility is nearly isotropic in the same plane, mu(xx)/mu(zz) approximate to 1.
dc.language.isoen
dc.publisherSPRINGER-VERLAG
dc.relation.ispartofAPPLIED PHYSICS B-LASERS AND OPTICS
dc.subjectCRYSTALS
dc.subjectOptics
dc.subjectPhysics
dc.subjectPhysics, Applied
dc.subjectSTEADY-STATE
dc.titleAnisotropy of the dielectric permittivity of Sn2P2S6 measured with light-induced grating techniques
dc.typejournal article
dc.identifier.doi10.1007/s00340-003-1094-x
dc.identifier.isiISI:000183396600014
dc.description.volume76
dc.description.issue4
dc.description.startpage417
dc.description.endpage421
dc.contributor.orcid0000-0003-3945-6454
dc.contributor.researcheridX-6554-2018
dc.publisher.place175 FIFTH AVE, NEW YORK, NY 10010 USA
dcterms.isPartOf.abbreviationAppl. Phys. B-Lasers Opt.
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