ANGULAR AND CHARGE-STATE DISTRIBUTIONS OF HIGHLY-CHARGED IONS SCATTERED DURING LOW-ENERGY SURFACE-CHANNELING INTERACTIONS WITH AU(110)

DC ElementWertSprache
dc.contributor.authorMEYER, FW
dc.contributor.authorFOLKERTS, L
dc.contributor.authorSCHIPPERS, S
dc.date.accessioned2021-12-23T16:14:07Z-
dc.date.available2021-12-23T16:14:07Z-
dc.date.issued1995
dc.identifier.issn0168583X
dc.identifier.urihttps://osnascholar.ub.uni-osnabrueck.de/handle/unios/10911-
dc.description10th International Workshop on Inelastic Ion-Surface Collisions (IISC-10), GRAND TARGHEE RESORT, WY, AUG 08-12, 1994
dc.description.abstractWe have measured scattered projectile angular and charge state distributions for 3.75 keV/amu O-q+ (3 less than or equal to q less than or equal to 8) and 1.2 keV/amu Ar-q+ (3 less than or equal to q less than or equal to 14) ions grazingly incident along the [110] and [100] directions of a Au(110) single crystal target. Scattered projectile angular distributions characteristic of surface channeling are observed. For both incident species, the dominant scattered charge fraction is neutral, which varies only by a few percent as a function of incident charge state. Significant O- formation is observed, which manifests a distinct velocity threshold. For incident Ar projectiles with open L-shell, the positive scattered charge fractions, while always less than about 10%, increase linearly with increasing number of initial L-shell vacancies.
dc.language.isoen
dc.publisherELSEVIER SCIENCE BV
dc.relation.ispartofNUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
dc.subjectACCELERATION
dc.subjectELECTRON-CAPTURE
dc.subjectEMISSION
dc.subjectGRAZING COLLISIONS
dc.subjectH FORMATION
dc.subjectInstruments & Instrumentation
dc.subjectNEUTRALIZATION
dc.subjectNuclear Science & Technology
dc.subjectPhysics
dc.subjectPhysics, Atomic, Molecular & Chemical
dc.subjectPhysics, Nuclear
dc.subjectRARE-GAS TARGETS
dc.subjectTUNGSTEN
dc.titleANGULAR AND CHARGE-STATE DISTRIBUTIONS OF HIGHLY-CHARGED IONS SCATTERED DURING LOW-ENERGY SURFACE-CHANNELING INTERACTIONS WITH AU(110)
dc.typeconference paper
dc.identifier.doi10.1016/0168-583X(94)00830-2
dc.identifier.isiISI:A1995RF42300030
dc.description.volume100
dc.description.issue2-3
dc.description.startpage366
dc.description.endpage372
dc.contributor.orcid0000-0002-6166-7138
dc.contributor.orcid0000-0002-6166-7138
dc.contributor.researcheridAAY-3754-2021
dc.contributor.researcheridA-7786-2008
dc.publisher.placePO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS
dcterms.isPartOf.abbreviationNucl. Instrum. Methods Phys. Res. Sect. B-Beam Interact. Mater. Atoms
dcterms.oaStatusGreen Submitted
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