XPS and morphological properties of Cr2O3 thin films grown by thermal evaporation method
Autor(en): | Kadari, Ahmed Schemme, Tobias Kadri, Dahane Wollschlaeger, Joachim |
Stichwörter: | AFM; CHEMICAL-VAPOR-DEPOSITION; CHROMIUM-OXIDE; Cr2O3; MAGNETIC-PROPERTIES; Materials Science; Materials Science, Multidisciplinary; MECHANICAL-PROPERTIES; MICROSTRUCTURE; NANOPARTICLES; Optical properties; OPTICAL-PROPERTIES; Physics; Physics, Multidisciplinary; SURFACE; Surface morphology; Thermal evaporation; Thin film; X-RAY; XPS | Erscheinungsdatum: | 2017 | Herausgeber: | ELSEVIER SCIENCE BV | Journal: | RESULTS IN PHYSICS | Volumen: | 7 | Startseite: | 3124 | Seitenende: | 3129 | Zusammenfassung: | In this paper chromium oxide (Cr2O3) thin films have been prepared onto MgO (0 0 1) substrate by thermal evaporation method at a pressure of about 1 x 10(-4) Pa. The morphology of the obtained thin films was investigated. These films show homogeneous and uniform distribution according to AFM images. The XPS measurements of chromium Cr 2p and oxygen O 1s peaks shows a good agreement when compared with another works cited in the literature. The micro-structural analysis, surface morphology and optical properties in the grown films were achieved using X-rays Photoelectron Spectroscopy (XPS), Atomic Force Microscopy (AFM), and Ultraviolet Visible (UV-Vis) spectroscopy. (C) 2017 The Authors. Published by Elsevier B.V. This is an open access article under the CC BY license. |
ISSN: | 22113797 | DOI: | 10.1016/j.rinp.2017.08.036 |
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geprüft am 15.05.2024