DC Field | Value | Language |
dc.contributor.author | Barth, C. | |
dc.contributor.author | Laffon, C. | |
dc.contributor.author | Olbrich, R. | |
dc.contributor.author | Ranguis, A. | |
dc.contributor.author | Parent, Ph. | |
dc.contributor.author | Reichling, M. | |
dc.date.accessioned | 2021-12-23T16:15:52Z | - |
dc.date.available | 2021-12-23T16:15:52Z | - |
dc.date.issued | 2016 | |
dc.identifier.issn | 20452322 | |
dc.identifier.uri | https://osnascholar.ub.uni-osnabrueck.de/handle/unios/11624 | - |
dc.description.abstract | In surface science and model catalysis, cerium oxide (ceria) is mostly grown as an ultra-thin film on a metal substrate in the ultra-high vacuum to understand fundamental mechanisms involved in diverse surface chemistry processes. However, such ultra-thin films do not have the contribution of a bulk ceria underneath, which is currently discussed to have a high impact on in particular surface redox processes. Here, we present a fully oxidized ceria thick film (180 nm) with a perfectly stoichiometric CeO2(111) surface exhibiting exceptionally large, atomically flat terraces. The film is well-suited for ceria model studies as well as a perfect substitute for CeO2 bulk material. | |
dc.description.sponsorship | COST ActionEuropean Cooperation in Science and Technology (COST) [CM1104]; Deutsche ForschungsgemeinschaftGerman Research Foundation (DFG) [RE 1186/12-1]; We express our great appreciation to M. H. Zoellner, G. Niu and T. Schroeder from the institute Innovations for High Performance Microelectronics (Frankfurt/Oder, Germany) for the preparation of the samples. Stimulating discussions on ceria redox properties and XPS data analysis with V. Ganduglia-Pirovano, G. E. Murgida, P. Luches and J.-I. Flege and support from the COST Action CM1104 and the Deutsche Forschungsgemeinschaft through grant RE 1186/12-1 are gratefully acknowledged. | |
dc.language.iso | en | |
dc.publisher | NATURE PUBLISHING GROUP | |
dc.relation.ispartof | SCIENTIFIC REPORTS | |
dc.subject | CATALYSIS | |
dc.subject | CEO2 BUFFER LAYERS | |
dc.subject | CHEMISTRY | |
dc.subject | DEFECT STRUCTURE | |
dc.subject | MORPHOLOGY | |
dc.subject | Multidisciplinary Sciences | |
dc.subject | OXIDE | |
dc.subject | RAY PHOTOELECTRON-SPECTROSCOPY | |
dc.subject | SAPPHIRE | |
dc.subject | SCANNING-TUNNELING-MICROSCOPY | |
dc.subject | Science & Technology - Other Topics | |
dc.subject | YBA2CU3O7-DELTA FILMS | |
dc.title | A perfectly stoichiometric and flat CeO2(111) surface on a bulk-like ceria film | |
dc.type | journal article | |
dc.identifier.doi | 10.1038/srep21165 | |
dc.identifier.isi | ISI:000370223800001 | |
dc.description.volume | 6 | |
dc.contributor.orcid | 0000-0002-6229-6471 | |
dc.contributor.orcid | 0000-0003-3186-9000 | |
dc.contributor.orcid | 0000-0003-4250-4533 | |
dc.contributor.researcherid | L-8396-2014 | |
dc.contributor.researcherid | B-1123-2011 | |
dc.contributor.researcherid | G-3543-2014 | |
dc.publisher.place | MACMILLAN BUILDING, 4 CRINAN ST, LONDON N1 9XW, ENGLAND | |
dcterms.isPartOf.abbreviation | Sci Rep | |
dcterms.oaStatus | Green Published, gold | |
crisitem.author.dept | FB 04 - Physik | - |
crisitem.author.deptid | fb04 | - |
crisitem.author.orcid | 0000-0003-3186-9000 | - |
crisitem.author.parentorg | Universität Osnabrück | - |
crisitem.author.netid | ReMi818 | - |