Nondestructive magneto-optical characterization of natural and artificial defects on 3 `' HTSC wafers at liquid nitrogen temperature

DC FieldValueLanguage
dc.contributor.authorEisenmenger, J
dc.contributor.authorSchiessling, J
dc.contributor.authorBolz, U
dc.contributor.authorRunge, BU
dc.contributor.authorLeiderer, P
dc.contributor.authorLorenz, M
dc.contributor.authorHochmuth, H
dc.contributor.authorWallenhorst, M
dc.contributor.authorDotsch, H
dc.date.accessioned2021-12-23T16:16:02Z-
dc.date.available2021-12-23T16:16:02Z-
dc.date.issued1999
dc.identifier.issn10518223
dc.identifier.urihttps://osnascholar.ub.uni-osnabrueck.de/handle/unios/11692-
dc.description1998 Applied Superconductivity Conference, PALM DESERT, CA, SEP 13-18, 1998
dc.description.abstractDouble-sided 3 `` HTSC Wafers were characterized by the magneto-optic technique. The presented apparatus allows a nondestructive and fast detection of local and extended inhomogeneities in the critical current density with high lateral resolution in the micrometer range. Additional gold-layers on the HTSC wafers, as they are sometimes used for the device production, do not influence the characterization result. The high sensitivity of the presented apparatus allows even the detection of local defects at higher temperature (77 K) where contrasts in the critical current are weaker and the magneto-optical characterization of HTSC thin films is much more difficult than at lower temperatures. So the apparatus can be used even under conditions where cooling with liquid helium or closed-cycle refrigerators is not available. The sensitivity was tested on natural and artificial defects, the latter being prepared by means of a focused laser beam.
dc.language.isoen
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
dc.relation.ispartofIEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY
dc.subjectANISOTROPY
dc.subjectCURRENTS
dc.subjectEngineering
dc.subjectEngineering, Electrical & Electronic
dc.subjectFIELD
dc.subjectMAGNETIZATION
dc.subjectPhysics
dc.subjectPhysics, Applied
dc.subjectSUPERCONDUCTORS
dc.subjectTHIN-FILMS
dc.titleNondestructive magneto-optical characterization of natural and artificial defects on 3 `' HTSC wafers at liquid nitrogen temperature
dc.typeconference paper
dc.identifier.doi10.1109/77.784815
dc.identifier.isiISI:000081964300105
dc.description.volume9
dc.description.issue2, 2
dc.description.startpage1840
dc.description.endpage1843
dc.contributor.orcid0000-0003-2774-6040
dc.contributor.researcheridA-1914-2010
dc.identifier.eissn15582515
dc.publisher.place445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
dcterms.isPartOf.abbreviationIEEE Trans. Appl. Supercond.
dcterms.oaStatusGreen Submitted
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