Investigations on ion beams from a high-current ion source

Autor(en): Ratschko, D
Zhou, BG
Knolle, D
Glaser, M
Stichwörter: Engineering; Engineering, Electrical & Electronic; Instruments & Instrumentation
Erscheinungsdatum: 1997
Herausgeber: IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Journal: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
Volumen: 46
Ausgabe: 2
Startseite: 588
Seitenende: 591
Zusammenfassung: 
An experimental study on an Ar+ beam extracted from a high-current ion source was performed. For beam diagnostics, the beam current and the discharge current as a function of the extraction voltage and of the screening voltage, respectively, were measured, The real two-dimensional beam profile was measured using a multisegmented Faraday cup, A mass spectrum of the ion beam was obtained adjusting the dipole magnet.
Beschreibung: 
Conference on Precision Electromagnetic Measurements (CPEM 96), BRAUNSCHWEIG, GERMANY, JUN 17-20, 1996
ISSN: 00189456
DOI: 10.1109/19.571925

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