Scanning tunneling microscopy of endohedral metallofullerene Tb@C-82 on C-60 film and Si(100) 2 x 1 surface
Autor(en): | Shi, BR Wang, XS Huang, HJ Yang, SH Heiland, W Cue, N |
Stichwörter: | AMORPHOUS-CARBON; Chemistry; Chemistry, Physical; CLUSTERS; COMPLEXES; ELUTION BEHAVIOR; FULLERENES; STM; Y-AT-C-82 | Erscheinungsdatum: | 2001 | Herausgeber: | AMER CHEMICAL SOC | Journal: | JOURNAL OF PHYSICAL CHEMISTRY B | Volumen: | 105 | Ausgabe: | 46 | Startseite: | 11414 | Seitenende: | 11418 | Zusammenfassung: | Endohedral metallofullerene Tb@C-82 molecules adsorbed on the C-60 film and Si(100) 2 x 1 have been investigated by scanning tunneling microscopy (STM). The C-60 film was obtained by depositing 2-3 monolayers (ML) of C-60 molecules on a highly oriented pyrolytic graphite (HOPG) surface. Tb@C-82 molecules have great mobility and aggregate along the edges of terraces on the C-60 film, and form a close-packing monolayer with increasing coverage. Very few trimers or dimers were imaged on the surface of C-60 film. In contrast, the Tb@C82 Molecules were randomly distributed on the surface of Si(100). These nucleation behaviors of Tb@C-82 molecules can be explained by the interaction of Tb@C-82-Si and Tb@C-82-Tb@C-82 that were brought on by the permanent dipole moment of Tb@C-82 Molecules. |
ISSN: | 15206106 | DOI: | 10.1021/jp0117112 |
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