Scanning tunneling microscopy of endohedral metallofullerene Tb@C-82 on C-60 film and Si(100) 2 x 1 surface
Autor(en): | Shi, BR Wang, XS Huang, HJ Yang, SH Heiland, W Cue, N |
Stichwörter: | AMORPHOUS-CARBON; Chemistry; Chemistry, Physical; CLUSTERS; COMPLEXES; ELUTION BEHAVIOR; FULLERENES; STM; Y-AT-C-82 | Erscheinungsdatum: | 2001 | Herausgeber: | AMER CHEMICAL SOC | Enthalten in: | JOURNAL OF PHYSICAL CHEMISTRY B | Band: | 105 | Ausgabe: | 46 | Startseite: | 11414 | Seitenende: | 11418 | ISSN: | 15206106 | DOI: | 10.1021/jp0117112 |
Show full item record