Scanning tunneling microscopy of endohedral metallofullerene Tb@C-82 on C-60 film and Si(100) 2 x 1 surface

Autor(en): Shi, BR
Wang, XS
Huang, HJ
Yang, SH
Heiland, W
Cue, N
Stichwörter: AMORPHOUS-CARBON; Chemistry; Chemistry, Physical; CLUSTERS; COMPLEXES; ELUTION BEHAVIOR; FULLERENES; STM; Y-AT-C-82
Erscheinungsdatum: 2001
Herausgeber: AMER CHEMICAL SOC
Journal: JOURNAL OF PHYSICAL CHEMISTRY B
Volumen: 105
Ausgabe: 46
Startseite: 11414
Seitenende: 11418
Zusammenfassung: 
Endohedral metallofullerene Tb@C-82 molecules adsorbed on the C-60 film and Si(100) 2 x 1 have been investigated by scanning tunneling microscopy (STM). The C-60 film was obtained by depositing 2-3 monolayers (ML) of C-60 molecules on a highly oriented pyrolytic graphite (HOPG) surface. Tb@C-82 molecules have great mobility and aggregate along the edges of terraces on the C-60 film, and form a close-packing monolayer with increasing coverage. Very few trimers or dimers were imaged on the surface of C-60 film. In contrast, the Tb@C82 Molecules were randomly distributed on the surface of Si(100). These nucleation behaviors of Tb@C-82 molecules can be explained by the interaction of Tb@C-82-Si and Tb@C-82-Tb@C-82 that were brought on by the permanent dipole moment of Tb@C-82 Molecules.
ISSN: 15206106
DOI: 10.1021/jp0117112

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