Scanning tunneling microscopy of endohedral metallofullerene Tb@C-82 on C-60 film and Si(100) 2 x 1 surface

Autor(en): Shi, BR
Wang, XS
Huang, HJ
Yang, SH
Heiland, W
Cue, N
Stichwörter: AMORPHOUS-CARBON; Chemistry; Chemistry, Physical; CLUSTERS; COMPLEXES; ELUTION BEHAVIOR; FULLERENES; STM; Y-AT-C-82
Erscheinungsdatum: 2001
Herausgeber: AMER CHEMICAL SOC
Enthalten in: JOURNAL OF PHYSICAL CHEMISTRY B
Band: 105
Ausgabe: 46
Startseite: 11414
Seitenende: 11418
ISSN: 15206106
DOI: 10.1021/jp0117112

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