Inner-shell excitation and fragmentation of sulfur aggregates

DC FieldValueLanguage
dc.contributor.authorTeodorescu, CM
dc.contributor.authorGravel, D
dc.contributor.authorChoi, J
dc.contributor.authorPugmire, D
dc.contributor.authorDowben, PA
dc.contributor.authorFominykh, N
dc.contributor.authorPavlychev, AA
dc.contributor.authorRuhl, E
dc.date.accessioned2021-12-23T16:18:34Z-
dc.date.available2021-12-23T16:18:34Z-
dc.date.issued1999
dc.identifier.issn03682048
dc.identifier.urihttps://osnascholar.ub.uni-osnabrueck.de/handle/unios/12750-
dc.description12th International Conference on Vacuum Ultraviolet Radiation Physics (VUV-12), SAN FRANCISCO, CA, AUG 03-07, 1998
dc.description.abstractVariable size sulfur aggregates (S-n with 3 less than or equal to n less than or equal to 8) were investigated in the S 2p excitation regime (160 eV less than or equal to E less than or equal to 175 eV) using monochromatic synchrotron radiation. Partial ion yields of mass-selected cations are compared with semiempirical extended Huckel calculations, yielding detailed information on the electronic and geometric structure of the aggregates. Inner-shell excitation in the S 2p regime leads to efficient formation of doubly charged species, which undergo rapid fragmentation via charge separation. The fragmentation pathways are investigated by photoelectron-photoion-photoion coincidence (PEPIPICO) spectroscopy. The charge separation mechanisms are interpreted in terms of Coulomb explosion. (C) 1999 Elsevier Science B.V. All rights reserved.
dc.language.isoen
dc.publisherELSEVIER SCIENCE BV
dc.relation.ispartofJOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
dc.subjectCLUSTERS
dc.subjectcoincidence spectroscopy
dc.subjectCOMPLEXES
dc.subjectextended Huckel calculations
dc.subjectinner-shell excitation
dc.subjectmass spectrometry
dc.subjectSpectroscopy
dc.subjectsulfur
dc.subjectVAPOR
dc.titleInner-shell excitation and fragmentation of sulfur aggregates
dc.typeconference paper
dc.identifier.doi10.1016/S0368-2048(98)00445-9
dc.identifier.isiISI:000081102000033
dc.description.volume101
dc.description.issueSI
dc.description.startpage193
dc.description.endpage198
dc.contributor.orcid0000-0003-1384-9049
dc.contributor.orcid0000-0002-5854-2916
dc.contributor.researcheridN-3796-2017
dc.contributor.researcheridM-6262-2013
dc.publisher.placePO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS
dcterms.isPartOf.abbreviationJ. Electron Spectrosc. Relat. Phenom.
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