Electronic structure of highly ordered Sr2FeMoO6: XPS and XES studies

DC FieldValueLanguage
dc.contributor.authorKuepper, K
dc.contributor.authorKadiroglu, M
dc.contributor.authorPostnikov, V
dc.contributor.authorPrince, KC
dc.contributor.authorMatteucci, M
dc.contributor.authorGalakhov, VR
dc.contributor.authorHesse, H
dc.contributor.authorBorstel, G
dc.contributor.authorNeumann, M
dc.date.accessioned2021-12-23T16:23:18Z-
dc.date.available2021-12-23T16:23:18Z-
dc.date.issued2005
dc.identifier.issn09538984
dc.identifier.urihttps://osnascholar.ub.uni-osnabrueck.de/handle/unios/14490-
dc.description.abstractWe have investigated the partial densities of states of Sr2FeMoO6 by applying soft x-ray emission spectroscopy (XES) to the Fe L, the Mo M and the O K edges. We discuss the results in the light of complementary measurements of the valence band by means of x-ray photoelectron spectroscopy (XPS) and first-principles generalized gradient approximation (GGA) and LDA U band structure calculations.
dc.language.isoen
dc.publisherIOP PUBLISHING LTD
dc.relation.ispartofJOURNAL OF PHYSICS-CONDENSED MATTER
dc.subjectAUGER
dc.subjectLDA+U METHOD
dc.subjectMAGNETORESISTANCE
dc.subjectPhysics
dc.subjectPhysics, Condensed Matter
dc.subjectPRINCIPLES
dc.subjectRADIATIVE RATES
dc.subjectSHELL COSTER-KRONIG
dc.subjectTH
dc.subjectYIELDS
dc.titleElectronic structure of highly ordered Sr2FeMoO6: XPS and XES studies
dc.typejournal article
dc.identifier.doi10.1088/0953-8984/17/27/007
dc.identifier.isiISI:000231003900010
dc.description.volume17
dc.description.issue27
dc.description.startpage4309
dc.description.endpage4317
dc.contributor.orcid0000-0002-1642-7362
dc.contributor.orcid0000-0002-5416-7354
dc.contributor.researcheridJ-6030-2013
dc.contributor.researcheridG-1397-2016
dc.publisher.placeTEMPLE CIRCUS, TEMPLE WAY, BRISTOL BS1 6BE, ENGLAND
dcterms.isPartOf.abbreviationJ. Phys.-Condes. Matter
crisitem.author.deptFB 04 - Physik-
crisitem.author.deptidfb04-
crisitem.author.parentorgUniversität Osnabrück-
crisitem.author.netidKuKa120-
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