Kelvin probe force microscopy studies of the charge effects upon adsorption of carbon nanotubes and C-60 fullerenes on hydrogen-terminated diamond

DC FieldValueLanguage
dc.contributor.authorKoelsch, S.
dc.contributor.authorFritz, F.
dc.contributor.authorFenner, M. A.
dc.contributor.authorKurch, S.
dc.contributor.authorWoehrl, N.
dc.contributor.authorMayne, A. J.
dc.contributor.authorDujardin, G.
dc.contributor.authorMeyer, C.
dc.date.accessioned2021-12-23T16:23:28Z-
dc.date.available2021-12-23T16:23:28Z-
dc.date.issued2018
dc.identifier.issn00218979
dc.identifier.urihttps://osnascholar.ub.uni-osnabrueck.de/handle/unios/14547-
dc.description.sponsorship``Niedersachsisches Vorab'' program of the Niedersachsisches Ministerium fur Wissenschaft und Kultur; Volkswagen-Stiftung through the program ``Integration of molecular components in functional macroscopic systems'' [86 391, 86 393, 9200]; We especially thank Angelika Kuhnle for her support and Felix Kling and Stefan Kuhn for helpful comments. We are grateful to Philipp Rahe for intense and insightful discussions about the intricacies of KPFM on insulating materials. We thank Francisco Romero Lairado and Hagen Songen for fruitful discussions, and Yevgeniy Shapiro and Rene Wieczorek for oxygen termination of diamonds. C.M. acknowledges funding by the ``Niedersachsisches Vorab'' program of the Niedersachsisches Ministerium fur Wissenschaft und Kultur. This work has been supported by the Volkswagen-Stiftung through the program ``Integration of molecular components in functional macroscopic systems,'' Grant Nos. 86 391, 86 393, and 9200.
dc.language.isoen
dc.publisherAMER INST PHYSICS
dc.relation.ispartofJOURNAL OF APPLIED PHYSICS
dc.subjectATOMIC-SCALE
dc.subjectCONDUCTIVITY
dc.subjectPhysics
dc.subjectPhysics, Applied
dc.subjectSINGLE-CRYSTAL DIAMOND
dc.subjectSURFACE
dc.titleKelvin probe force microscopy studies of the charge effects upon adsorption of carbon nanotubes and C-60 fullerenes on hydrogen-terminated diamond
dc.typejournal article
dc.identifier.doi10.1063/1.5019486
dc.identifier.wosWOS:000419393400025
dc.description.volume123
dc.description.issue1
dc.contributor.orcid0000-0003-0851-2767
dc.contributor.orcid0000-0002-6304-8795
dc.contributor.orcid0000-0002-4583-9198
dc.contributor.researcheridI-1723-2012
dc.identifier.eissn10897550
dc.publisher.place1305 WALT WHITMAN RD, STE 300, MELVILLE, NY 11747-4501 USA
dcterms.isPartOf.abbreviationJ. Appl. Phys.
crisitem.author.deptUniversität Osnabrück-
crisitem.author.deptFB 04 - Physik-
crisitem.author.deptidfb04-
crisitem.author.orcid0000-0003-0851-2767-
crisitem.author.parentorgUniversität Osnabrück-
crisitem.author.netidKuSv001-
crisitem.author.netidDuGe001-
crisitem.author.netidMeCa197-
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