Observation of skipping motion in small-angle ion-surface Scattering

Abstract

We report the observation of skipping motion of 200-2000-eV Si+ beams on a smooth Cu(111) surface under grazing (1°-14°) angles of incidence. The kinetic-energy distributions of specularly scatered Si+ and Si- ions exhibit discrete energy-loss features corresponding to an integral number of reflections. Energy losses up to 20% of the incident beam energy, associated with five reflections in a binding potential, are identified. Classical trajectory calculations imply that the beam is trapped following an energy loss, by substrate electron-hole pair or collective excitation, which exceeds the incident-beam-energy component normal to the surface. © 1988 The American Physical Society.