Direct silica encapsulation of SERS labels via SAMs containing terminal SiO2 precursors

DC FieldValueLanguage
dc.contributor.authorSchütz, M.
dc.contributor.authorKüstner, B.
dc.contributor.authorBauer, M.
dc.contributor.authorSchmuck, C.
dc.contributor.authorSchlücker, S.
dc.date.accessioned2021-12-23T16:28:53Z-
dc.date.available2021-12-23T16:28:53Z-
dc.date.issued2010
dc.identifier.isbn9780735408180
dc.identifier.issn0094243X
dc.identifier.urihttps://osnascholar.ub.uni-osnabrueck.de/handle/unios/15974-
dc.descriptionConference of 22nd International Conference on Raman Spectroscopy, ICORS 2010 ; Conference Date: 8 August 2010 Through 13 August 2010; Conference Code:82663
dc.description.sponsorshipNortheastern University; Boston University and The Photonics Center; Horiba Scientific; Thermo Scientific; Bruker Optics
dc.language.isoen
dc.relation.ispartofAIP Conference Proceedings
dc.titleDirect silica encapsulation of SERS labels via SAMs containing terminal SiO2 precursors
dc.typeconference paper
dc.identifier.doi10.1063/1.3482273
dc.identifier.scopus2-s2.0-78649955830
dc.identifier.urlhttps://www.scopus.com/inward/record.uri?eid=2-s2.0-78649955830&doi=10.1063%2f1.3482273&partnerID=40&md5=8687ebe06dc2ac43401b776949bfcb64
dc.description.volume1267
dc.description.startpage1023
dc.description.endpage1024
dc.publisher.placeBoston, MA
dcterms.isPartOf.abbreviationAIP Conf. Proc.
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