Time and memory-aware runtime monitoring for executing model-based test cases in embedded systems
Autor(en): | Iyenghar, P. Pulvermueller, E. Spieker, M. Wuebbelmann, J. Westerkamp, C. |
Stichwörter: | Embedded systems; Empirical evaluations; Model based testing; Model-Based Testing (MBT); Monitoring methodologies; Network components; On-chip monitoring; Prototype implementations; Resource-constrained embedded systems; runtime monitoring; test framework; Test framework, Information science; Tools, Embedded systems | Erscheinungsdatum: | 2013 | Journal: | IEEE International Conference on Industrial Informatics (INDIN) | Startseite: | 506 | Seitenende: | 512 | Zusammenfassung: | The existing model-based tools employ runtime monitoring methodologies for debugging and testing of embedded systems. In these tools, the additional instrumentation for incorporating and executing the test code varies based on the application. Such techniques could also introduce significant, non-deterministic overhead in the embedded system. This is a hurdle in applying Model-Based Testing (MBT) for resource constrained embedded systems and industrially relevant examples. To address this gap, this paper elaborates on the monitoring methodology used in a test framework for executing the model-based test cases in the embedded system. Two variants of the proposed monitoring methodology, (a) software and (b) on-chip monitoring are discussed. An empirical evaluation based on a prototype implementation of the proposed runtime monitoring mechanisms is discussed. © 2013 IEEE. |
Beschreibung: | Conference of 2013 11th IEEE International Conference on Industrial Informatics, INDIN 2013 ; Conference Date: 29 July 2013 Through 31 July 2013; Conference Code:101107 |
ISBN: | 9781479907526 | ISSN: | 19354576 | DOI: | 10.1109/INDIN.2013.6622936 | Externe URL: | https://www.scopus.com/inward/record.uri?eid=2-s2.0-84889062161&doi=10.1109%2fINDIN.2013.6622936&partnerID=40&md5=ef54ad364295314c8801825f1a3b345f |
Zur Langanzeige