Model-based test case generation by reusing models from runtime monitoring of deeply embedded systems

Autor(en): Iyenghar, P.
Wuebbelmann, J.
Westerkamp, C.
Pulvermueller, E. 
Stichwörter: Deeply embedded systems; Model-based runtime monitoring; Model-based test; Novel applications; Prototype implementations; Reusing models; Runtime Monitoring; Test case generation; UML; UML, Network components, Embedded systems
Erscheinungsdatum: 2013
Journal: IEEE Embedded Systems Letters
Volumen: 5
Ausgabe: 3
Startseite: 38
Seitenende: 41
Zusammenfassung: 
This letter introduces a novel application of model-based runtime monitoring of deeply embedded systems. The proposed framework comprises of a minimally intrusive, generic, software-based, runtime monitoring methodology for visualizing the behavior of deeply embedded systems in real-time. The model-based runtime monitoring results are then reused for generating model-based test cases. A prototype implementation of the proposed framework is discussed along with examples. © 2009-2012 IEEE.
ISSN: 19430663
DOI: 10.1109/LES.2013.2264502
Externe URL: https://www.scopus.com/inward/record.uri?eid=2-s2.0-84883562131&doi=10.1109%2fLES.2013.2264502&partnerID=40&md5=69b2bb7de4b368f8c30d20e55d23aacc

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