Integrated model-based approach and test framework for embedded systems

DC ElementWertSprache
dc.contributor.authorIyenghar, P.
dc.contributor.authorPulvermueller, E.
dc.contributor.authorWesterkamp, C.
dc.contributor.authorWuebbelmann, J.
dc.date.accessioned2021-12-23T16:31:09Z-
dc.date.available2021-12-23T16:31:09Z-
dc.date.issued2011
dc.identifier.isbn9782953050448
dc.identifier.urihttps://osnascholar.ub.uni-osnabrueck.de/handle/unios/16926-
dc.descriptionConference of 2011 14th Forum on Specification and Design Lanugage, FDL 2011 ; Conference Date: 13 September 2011 Through 15 September 2011; Conference Code:87534
dc.description.abstractIn the recent decade, new automated methodologies such as the Model Driven Development (MDD) and Model-Based Testing (MBT) are under evaluation for embedded systems development and testing. However, most of the currently existing MBT approaches are neither integrated with the software development process nor transferred to real-life embedded software engineering projects. There is also a lack of usage of corresponding modeling languages for the MDD and MBT phases. In this context, this paper discusses the applicability of an integrated model-based approach and test framework which addresses the aforementioned gaps. The approach is evaluated in a spark extinguishing embedded system example based on a real-life embedded software engineering project. A test framework generation algorithm which generates the necessary artifacts for deploying MBT in resource-constrained embedded systems is discussed. A prototype implementation of the proposed approach and illustrative examples are presented. © 2011 ECSI.
dc.description.sponsorshipElectronic Chips and Systems design Initiative (ECSI); OFFIS - Institute for Information Technology; IEEE Council on Electronic Design Automation; IEEE; accellera
dc.language.isoen
dc.relation.ispartofForum on Specification and Design Languages
dc.subjectembedded systems
dc.subjectExample based
dc.subjectGeneration algorithm
dc.subjectIllustrative examples
dc.subjectIntegration
dc.subjectModel based approach
dc.subjectModel based testing
dc.subjectModel-Based Testing (MBT)
dc.subjectModel-driven development
dc.subjectModeling languages
dc.subjectPrototype implementations
dc.subjectResource-constrained
dc.subjectSoftware design
dc.subjectSoftware development process
dc.subjectSpecifications, Embedded systems
dc.subjectSystems development
dc.subjecttest framework
dc.subjectUML
dc.subjectUTP
dc.subjectUTP, Embedded software
dc.titleIntegrated model-based approach and test framework for embedded systems
dc.typeconference paper
dc.identifier.scopus2-s2.0-82955164985
dc.identifier.urlhttps://www.scopus.com/inward/record.uri?eid=2-s2.0-82955164985&partnerID=40&md5=eaacd42fdc5ff437a8aaa435bbc3d8bd
dc.description.startpage108
dc.description.endpage115
dc.publisher.placeOldenburg
dcterms.isPartOf.abbreviationForum Specifi. Des. Lang.
crisitem.author.deptInstitut für Informatik-
crisitem.author.deptidinstitute12-
crisitem.author.parentorgFB 06 - Mathematik/Informatik/Physik-
crisitem.author.grandparentorgUniversität Osnabrück-
crisitem.author.netidPuEl525-
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