Integrated model-based approach and test framework for embedded systems
DC Element | Wert | Sprache |
---|---|---|
dc.contributor.author | Iyenghar, P. | |
dc.contributor.author | Pulvermueller, E. | |
dc.contributor.author | Westerkamp, C. | |
dc.contributor.author | Wuebbelmann, J. | |
dc.date.accessioned | 2021-12-23T16:31:09Z | - |
dc.date.available | 2021-12-23T16:31:09Z | - |
dc.date.issued | 2011 | |
dc.identifier.isbn | 9782953050448 | |
dc.identifier.uri | https://osnascholar.ub.uni-osnabrueck.de/handle/unios/16926 | - |
dc.description | Conference of 2011 14th Forum on Specification and Design Lanugage, FDL 2011 ; Conference Date: 13 September 2011 Through 15 September 2011; Conference Code:87534 | |
dc.description.abstract | In the recent decade, new automated methodologies such as the Model Driven Development (MDD) and Model-Based Testing (MBT) are under evaluation for embedded systems development and testing. However, most of the currently existing MBT approaches are neither integrated with the software development process nor transferred to real-life embedded software engineering projects. There is also a lack of usage of corresponding modeling languages for the MDD and MBT phases. In this context, this paper discusses the applicability of an integrated model-based approach and test framework which addresses the aforementioned gaps. The approach is evaluated in a spark extinguishing embedded system example based on a real-life embedded software engineering project. A test framework generation algorithm which generates the necessary artifacts for deploying MBT in resource-constrained embedded systems is discussed. A prototype implementation of the proposed approach and illustrative examples are presented. © 2011 ECSI. | |
dc.description.sponsorship | Electronic Chips and Systems design Initiative (ECSI); OFFIS - Institute for Information Technology; IEEE Council on Electronic Design Automation; IEEE; accellera | |
dc.language.iso | en | |
dc.relation.ispartof | Forum on Specification and Design Languages | |
dc.subject | embedded systems | |
dc.subject | Example based | |
dc.subject | Generation algorithm | |
dc.subject | Illustrative examples | |
dc.subject | Integration | |
dc.subject | Model based approach | |
dc.subject | Model based testing | |
dc.subject | Model-Based Testing (MBT) | |
dc.subject | Model-driven development | |
dc.subject | Modeling languages | |
dc.subject | Prototype implementations | |
dc.subject | Resource-constrained | |
dc.subject | Software design | |
dc.subject | Software development process | |
dc.subject | Specifications, Embedded systems | |
dc.subject | Systems development | |
dc.subject | test framework | |
dc.subject | UML | |
dc.subject | UTP | |
dc.subject | UTP, Embedded software | |
dc.title | Integrated model-based approach and test framework for embedded systems | |
dc.type | conference paper | |
dc.identifier.scopus | 2-s2.0-82955164985 | |
dc.identifier.url | https://www.scopus.com/inward/record.uri?eid=2-s2.0-82955164985&partnerID=40&md5=eaacd42fdc5ff437a8aaa435bbc3d8bd | |
dc.description.startpage | 108 | |
dc.description.endpage | 115 | |
dc.publisher.place | Oldenburg | |
dcterms.isPartOf.abbreviation | Forum Specifi. Des. Lang. | |
crisitem.author.dept | Institut für Informatik | - |
crisitem.author.deptid | institute12 | - |
crisitem.author.parentorg | FB 06 - Mathematik/Informatik/Physik | - |
crisitem.author.grandparentorg | Universität Osnabrück | - |
crisitem.author.netid | PuEl525 | - |
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