Towards model-based test automation for embedded systems using UML and UTP
Autor(en): | Iyenghar, P. Pulvermueller, E. Westerkamp, C. |
Stichwörter: | Generation algorithm; Model based testing; Model-based test; Model-driven development; Real-time embedded systems; Resource-constrained; Testing profile; Tool support, Embedded software; Factory automation; Real time systems; Software engineering; Software testing; Unified Modeling Language, Embedded systems | Erscheinungsdatum: | 2011 | Journal: | IEEE International Conference on Emerging Technologies and Factory Automation, ETFA | Zusammenfassung: | Model-based methodologies such as the Model-Driven Development (MDD) and Model-Based Testing (MBT) are being explored, in the recent decade, for automation in embedded software engineering projects. In this context, the target of this paper is to demonstrate the adoption and applicability of the Unified Modeling Language (UML) and the UML Testing Profile (UTP) for deploying MBT in Resource-Constrained (RC)-Real-Time Embedded Systems (RTES). Though the UTP standard has been introduced several years ago, concrete approaches or tool support for generating the test artifacts based on the UTP is currently unavailable. This paper aims to close this gap and discusses a concise set of UTP artifacts in the context of MBT for RC-RTES. A detailed discussion on the test artifacts generation algorithm demonstrating the applicability of our approach in a real-life RC-RTES example is presented. © 2011 IEEE. |
Beschreibung: | Conference of 2011 IEEE 16th Conference on Emerging Technologies and Factory Automation, ETFA 2011 ; Conference Date: 5 September 2011 Through 9 September 2011; Conference Code:87207 |
ISBN: | 9781457700187 | DOI: | 10.1109/ETFA.2011.6058982 | Externe URL: | https://www.scopus.com/inward/record.uri?eid=2-s2.0-80655132157&doi=10.1109%2fETFA.2011.6058982&partnerID=40&md5=7f08567a43b206e621283f428c0b1f71 |
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