Design level debugging of timing behavior in embedded systems: Using a model-based approach

Autor(en): Iyenghar, P.
Westerkamp, C.
Wuebbelmann, J.
Pulvermueller, E. 
Stichwörter: Design levels; embedded systems; Embedded target; End users; Illustrative examples; Industry; Industry standards; Information science; Memory size; Model based approach; model-based debugging; Model-driven development; Program debugging; Prototype implementations; Real time systems; Systems analysis, Mathematical models; Temporal constraints; Testing technique; Timing diagrams, Design; UML timing diagram
Erscheinungsdatum: 2011
Journal: IEEE International Conference on Industrial Informatics (INDIN)
Startseite: 889
Seitenende: 894
Zusammenfassung: 
A robust model-based debugging and testing technique integrated with the Model Driven Development (MDD) approach for memory size constrained, real-time critical embedded target systems is still in its nascent stages. This is especially true for the industry standard MDD-based tools. In addition, a model-based debugging technique or tool chain based on the newly introduced timing diagrams in UML 2.x is not yet available. In this paper, we discuss a model-based, design-level debugging approach with which the timing behavior of embedded targets is visualized with the aid of UML timing diagrams on the host side, in real-time. The proposed approach is suitable for memory size constrained, real-time embedded target systems as the overhead introduced is negligible, constant and known beforehand. Hence, the end-user has the option to include the overhead in the system design phase, thereby making use of a model-based debug solution and at the same time adhering to temporal constraints. A prototype implementation of the proposed approach is discussed and an illustrative example is presented. © 2011 IEEE.
Beschreibung: 
Conference of 2011 9th IEEE International Conference on Industrial Informatics, INDIN 2011 ; Conference Date: 26 July 2011 Through 29 July 2011; Conference Code:87011
ISBN: 9781457704345
ISSN: 19354576
DOI: 10.1109/INDIN.2011.6035011
Externe URL: https://www.scopus.com/inward/record.uri?eid=2-s2.0-80055010610&doi=10.1109%2fINDIN.2011.6035011&partnerID=40&md5=5a80b7aa7f19656442fa86b5ed8b1fc3

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