A novel approach towards model-driven reliability analysis of Simulink models

Autor(en): Iyenghar, P.
Wessels, S.
Noyer, A.
Pulvermueller, E. 
Westerkamp, C.
Stichwörter: Automation; Embedded Software Engineering (ESE); Engineering systems; Factory automation; Fault tree analyses (FTA); Fault tree analysis; Fault Tree Analysis (FTA); MATLAB; MATLAB /simulink; Matlab/Simulink; Non functional properties; Reliability; Reliability and safeties; Reliability attributes; Research challenges, Reliability analysis; Software engineering; Software reliability; Specifications, Automated modeling
Erscheinungsdatum: 2016
Herausgeber: Institute of Electrical and Electronics Engineers Inc.
Journal: IEEE International Conference on Emerging Technologies and Factory Automation, ETFA
Volumen: 2016-November
Zusammenfassung: 
In the recent decade, many formalisms and tools have emerged for model-driven Non-Functional Property (NFP) specification and assessment. In this direction, model-driven reliability and safety assessment of engineering systems developed using Matlab/Simulink is an emerging research challenge. However, a generic mechanism for NFP specification in the Simulink design model is not yet supported. Further, a completely automated model-based workflow for synthesis of a NFP analysis model and its subsequent analysis in a NFP analysis tool is missing. In this context, this paper proposes a novel approach and a fully automated workflow towards model-driven reliability analysis of Simulink models. An approach to annotate the Simulink design models with reliability attributes and subsequent synthesis of fault trees from the annotated design model is described. A prototype and initial experimental results are discussed. © 2016 IEEE.
Beschreibung: 
Conference of 21st IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2016 ; Conference Date: 6 September 2016 Through 9 September 2016; Conference Code:124646
ISBN: 9781509013142
ISSN: 19460740
DOI: 10.1109/ETFA.2016.7733505
Externe URL: https://www.scopus.com/inward/record.uri?eid=2-s2.0-84996538529&doi=10.1109%2fETFA.2016.7733505&partnerID=40&md5=947e05cb0dbff02b11ea02b2a064a273

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