Surface potential response from GaP nanowires synthesized with mixed crystal phases

Autor(en): Kyeyune, B.
Soboleva, E.
Geydt, P.
Khayrudinov, V.
Alekseev, P.
Lipsanen, H.
Lähderanta, E.
Herausgeber: Averkiev, N.S.
Poniaev, S.A.
Sokolovskii, G.S.
Stichwörter: Atomic force microscopy; Crystal impurities; Gallium phosphide; III-V semiconductors; Nanowires; Numerical methods; Surface potential; Zinc sulfide, Average difference; Electrical transport properties; Growth directions; Kelvin probe force microscopy; Mixed crystals; Peak-force tappings; Potential response; Structure dependent, Crystal structure
Erscheinungsdatum: 2019
Herausgeber: Institute of Physics Publishing
Enthalten in: Journal of Physics: Conference Series
Band: 1400
Ausgabe: 4
Zusammenfassung: 
In this work, we investigate variations of surface potentials along a single gallium phosphide (GaP) nanowire (NW) synthesized with a mixed crystal phase along the growth direction. GaP NWs synthesized with both wurtzite (WZ) and zincblende (ZB) phases were studied. The measurements were performed on a standard Atomic Force Microscopy (AFM) set-up equipped with Kelvin Probe Force Microscopy (KPFM) module in PeakForce Tapping Mode. KPFM Measurements from two structures were analyzed. Variations of surface poten-tials were observed in a single GaP NW with WZ/ZB segments. An average difference in surface potential was 55±11 mV. This is explained by different crystal structures along the NW. The work expands the understanding of crystal structure-dependent electrical transport properties of GaP NWs. © Published under licence by IOP Publishing Ltd.
Beschreibung: 
Conference of International Conference PhysicA.SPb 2019 ; Conference Date: 22 October 2019 Through 24 October 2019; Conference Code:156106
ISSN: 17426588
DOI: 10.1088/1742-6596/1400/4/044018
Externe URL: https://www.scopus.com/inward/record.uri?eid=2-s2.0-85077590690&doi=10.1088%2f1742-6596%2f1400%2f4%2f044018&partnerID=40&md5=4008f5cc48ee10c89556a997fe73a9d9

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