Phonon scattering in reflection high-energy electron diffraction: Multiple-scattering theory and experiment

Autor(en): Korte, U
Stichwörter: ATOMS; DIFFUSE-SCATTERING; DYNAMICAL DIFFRACTION; INTENSITIES; Materials Science; Materials Science, Multidisciplinary; MICROSCOPY; Physics; Physics, Applied; Physics, Condensed Matter; PT(111); RESOLUTION; RHEED; ROUGH SURFACES; TRANSITION
Erscheinungsdatum: 1997
Volumen: 56
Ausgabe: 23
Startseite: 15320
Seitenende: 15331
A multiple-scattering formalism, based on the reflectivity matrix method of diffuse reflection high-energy electron diffraction (RHEED), is developed that allows us to calculate the electron-phonon scattering in RHEED due to correlated thermal vibrations for the case of one-phonon transitions. The scattering by the thermal displacements is calculated in first-order perturbation theory whereas the propagation of the diffusely scattered electrons in the periodic part of the scattering potential is treated exactly. The approach is particularly capable of treating the multiple electron scattering independently from the experimentally accessible and vibration dependent quantities. These quantities, the atomic displacement correlations, are described in terms of intralayer and interlayer correlation matrices, resolved with respect to the in-plane phonon momentum. Calculations for Pt(111) are presented and used to interpret experimentally obtained energy filtered streak profiles of the quasielastic thermal diffuse scattering (losses <2eV). The general features of the phonon scattering are elucidated. Furthermore, the information depth and the influence of different atomic displacement directions on the diffuse intensities is investigated. An attempt is presented to ``measure'' the correlation matrices by means of an evaluation of the experimental data. The analysis produces good agreement between experiment and theory in conjunction with physically sensible correlation matrices that exhibit some specific properties expected for surfaces.
ISSN: 10980121
DOI: 10.1103/PhysRevB.56.15320

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