XPS study of photorefractive Sr0.61Ba0.39Nb2O6:Ce crystals

Autor(en): Niemann, R
Buse, K
Pankrath, R
Neumann, M
Stichwörter: CE; Physics; Physics, Condensed Matter; SPECTRA
Erscheinungsdatum: 1996
Herausgeber: PERGAMON-ELSEVIER SCIENCE LTD
Journal: SOLID STATE COMMUNICATIONS
Volumen: 98
Ausgabe: 3
Startseite: 209
Seitenende: 213
Zusammenfassung: 
X-ray photoelectron spectroscopy (XPS) measurements show that Ce occurs in photorefractive Sr0.61Ba0.39Nb2O6 (SBN) crystals mainly in the valence state 3+. We give arguments that Ce-3+/4+ is the photorefractive center in SBN:Ce with a typical concentration ratio c(Ce?(3+))/c(Ce?(4+)) = 600. Quantitative analysis of the XPS data yields a Ce distribution coefficient of about 0.6 /- 0.3.
ISSN: 00381098
DOI: 10.1016/0038-1098(96)00087-7

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