X-ray photoelectron diffraction of ABO(3)-type perovskites: site determination for dopants

DC ElementWertSprache
dc.contributor.authorSchneider, B
dc.contributor.authorNiemann, R
dc.contributor.authorKuper, C
dc.contributor.authorHesse, H
dc.contributor.authorNeumann, M
dc.date.accessioned2021-12-23T15:57:45Z-
dc.date.available2021-12-23T15:57:45Z-
dc.date.issued1998
dc.identifier.issn03682048
dc.identifier.urihttps://osnascholar.ub.uni-osnabrueck.de/handle/unios/3109-
dc.description2nd German/Russian Symposium on Electron and X-Ray Spectroscopy, MAX PLANCK SOC, HARNACK HAUS, BERLIN, GERMANY, NOV 02-05, 1997
dc.description.abstractWe present a set of polar-angle-dependent X-ray photoelectron spectra (XPS) obtained from in-situ-cleaved KNbO3. The angle-dependent variation of intensity can be explained by the diffraction of the photoemitted electron by the surrounding atoms. This anisotropy in intensity may be used to determine the lattice site of the emitting atom. Measurements were carried out on KTa1-xNbxO3 single crystals (x = 0.92). In spite of the low concentration of Ta, the atomic position of this element could be deduced from a comparison of the angle-dependent spectra, giving a hint that both tantalum and niobium occupy the same lattice site. Angle-dependent measurements were carried out on Ba0.77Ca0.23TiO3 single crystals in order to determine the atomic position of the calcium atoms. Extended comparison of the measurements leads to the assumption that calcium is located on the barium site only. (C) 1998 Elsevier Science B.V. All rights reserved.
dc.language.isoen
dc.publisherELSEVIER SCIENCE BV
dc.relation.ispartofJOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
dc.subjectCRYSTALS
dc.subjectELECTRON
dc.subjectGROWTH
dc.subjectperovskite structure
dc.subjectphotoelectron diffraction
dc.subjectphotoelectron spectroscopy
dc.subjectSCATTERING
dc.subjectSpectroscopy
dc.titleX-ray photoelectron diffraction of ABO(3)-type perovskites: site determination for dopants
dc.typeconference paper
dc.identifier.doi10.1016/S0368-2048(98)00220-5
dc.identifier.isiISI:000077840100007
dc.description.volume96
dc.description.issue1-3
dc.description.startpage37
dc.description.endpage42
dc.publisher.placePO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS
dcterms.isPartOf.abbreviationJ. Electron Spectrosc. Relat. Phenom.
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