Manipulation of C-60 islands on the rutile TiO2 (110) surface using noncontact atomic force microscopy

Autor(en): Loske, Felix
Kuehnle, Angelika
Stichwörter: atomic force microscopy; domain boundaries; fullerenes; LATERAL MANIPULATION; MOLECULE; Physics; Physics, Applied; SCANNING TUNNELING MICROSCOPE; SINGLE ATOMS; TIP
Erscheinungsdatum: 2009
Herausgeber: AMER INST PHYSICS
Journal: APPLIED PHYSICS LETTERS
Volumen: 95
Ausgabe: 4
Zusammenfassung: 
Regular, almost quadratic pits were created in an island of C-60 molecules on a rutile TiO2 (110) surface using noncontact atomic force microscopy at room temperature. Upon gradually approaching the scanning tip toward the surface, the interaction between the tip and the C-60 island was increased until manipulation was achieved. Analyzing the manipulation process unambiguously revealed that the manipulation was performed in the repulsive regime. Retracting the tip allowed for reproducible imaging the C-60 island after the manipulation process. Moreover, whole islands could be reshaped or even removed when scanning with appropriate scanning parameters.
ISSN: 00036951
DOI: 10.1063/1.3184784

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