Contrast inversion in non-contact atomic force microscopy imaging of C-60 molecules

Autor(en): Loske, Felix
Rahe, Philipp 
Kuehnle, Angelika
Stichwörter: C60 MOLECULES; DEFECTS; Materials Science; Materials Science, Multidisciplinary; Nanoscience & Nanotechnology; Physics; Physics, Applied; RESOLUTION; Science & Technology - Other Topics; SOLID C-60; SURFACE; TEMPERATURE
Erscheinungsdatum: 2009
Herausgeber: IOP PUBLISHING LTD
Journal: NANOTECHNOLOGY
Volumen: 20
Ausgabe: 26
Zusammenfassung: 
Non-contact atomic force microscopy (NC-AFM) was applied to study C-60 molecules on rutile TiO2(110). Depending on the tip-sample distance, distinctly different molecular contrasts are observed. Systematically decreasing the tip-sample distance results in contrast inversion that is obtained reproducibly on the C-60 islands. This change in contrast can be related to frequency shift versus distance (d f (z)) curves at different sample sites, unraveling crossing points in the d f (z) curves in the attractive regime. We have performed simulations based on a simple Morse potential, which reproduce the experimental results. This combined experimental and simulation study provides insight into the mechanisms responsible for molecular contrast in NC-AFM imaging. Moreover, this work demonstrates the importance of distance-dependent measurements for unambiguously identifying molecular positions within a molecular island using NC-AFM.
ISSN: 09574484
DOI: 10.1088/0957-4484/20/26/264010

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