Double sample holder for efficient high-resolution studies of an insulator and a metal surface

Autor(en): Heggemann, Jonas
Lafloer, Linda
Rahe, Philipp 
Stichwörter: FORCE MICROSCOPY; Instruments & Instrumentation; Physics; Physics, Applied; SCANNING TUNNELING MICROSCOPE
Erscheinungsdatum: 2021
Herausgeber: AIP Publishing
Journal: REVIEW OF SCIENTIFIC INSTRUMENTS
Volumen: 92
Ausgabe: 5
Zusammenfassung: 
A double sample holder supporting both a metal sample and an insulator crystal for high-resolution scanning probe microscopy experiments is described. The metal sample serves as a substrate for tip preparation and tip functionalization to efficiently and reliably enable high-resolution studies of the adjacent insulator surface. Imaging of Ag(111)/mica, Au(111)/mica, CaF2(111), and calcite(104) surfaces is demonstrated at 5 K, including images on calcite(104) produced with a CO terminated tip, which was prepared on the adjacent metal sample. Published under license by AIP Publishing.
ISSN: 00346748
DOI: 10.1063/5.0041172

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