SLOWING DOWN AND SCATTERING OF IONS IN SOLIDS

Autor(en): HEILAND, W
DERKS, H
BREMER, T
Stichwörter: ELECTRONIC STOPPING; IMPLANTATION; ION BEAM MIXING; ION IMPLANTATION; ION SCATTERING SPECTROMETRY; Microscopy; NUCLEAR STOPPING; OPTICAL WAVE-GUIDES; RADIATION DAMAGE; SECONDARY ION MASS SPECTROMETRY; SURFACE; SURFACE CHANNELING; SURFACE STRUCTURE; WAVE-GUIDES
Erscheinungsdatum: 1990
Herausgeber: SCANNING MICROSCOPY INT
Enthalten in: SCANNING MICROSCOPY
Ausgabe: 4
Startseite: 257
Seitenende: 263
ISSN: 08917035

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