SLOWING DOWN AND SCATTERING OF IONS IN SOLIDS
Autor(en): | HEILAND, W DERKS, H BREMER, T |
Stichwörter: | ELECTRONIC STOPPING; IMPLANTATION; ION BEAM MIXING; ION IMPLANTATION; ION SCATTERING SPECTROMETRY; Microscopy; NUCLEAR STOPPING; OPTICAL WAVE-GUIDES; RADIATION DAMAGE; SECONDARY ION MASS SPECTROMETRY; SURFACE; SURFACE CHANNELING; SURFACE STRUCTURE; WAVE-GUIDES | Erscheinungsdatum: | 1990 | Herausgeber: | SCANNING MICROSCOPY INT | Enthalten in: | SCANNING MICROSCOPY | Ausgabe: | 4 | Startseite: | 257 | Seitenende: | 263 | ISSN: | 08917035 |
Show full item record