MULTILAYER MODEL FOR ANALYSIS OF SURFACE IMPERFECTIONS BY LEED

Autor(en): TOUGAARD, S
SAALFELD, H
BOLWIN, K
NEUMANN, M
Stichwörter: Chemistry; Chemistry, Physical; Physics; Physics, Condensed Matter
Erscheinungsdatum: 1986
Herausgeber: ELSEVIER SCIENCE BV
Journal: SURFACE SCIENCE
Volumen: 169
Ausgabe: 1
Startseite: L266-L272
ISSN: 00396028
DOI: 10.1016/0039-6028(86)90732-6

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