Characterization and modeling of transient device behavior under CDM ESD stress
| Autor(en): | Willemen, J. Andreini, Antonio Heyn, V. De Esmark, Kai Etherton, M. Gieser, H. Groeseneken, Guido Mettler, S. Morena, E. Qu, N. Soppa, W. Stadler, Wolfgang Stella, R. Wilkening, Wolfgang Wolf, Heinrich Zullino, Lucia |
Stichwörter: | Stress (linguistics); Electrostatic discharge; Electronic engineering; Materials science; Transient (computer programming); Snapback | Erscheinungsdatum: | 2003 | Herausgeber: | IEEE | Journal: | electrical overstress/electrostatic discharge symposium | Startseite: | 1 | Seitenende: | 10 | Externe URL: | http://yadda.icm.edu.pl/yadda/element/bwmeta1.element.ieee-000005272035 |
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