Lateral manipulation of atomic size defects on the CaF2(111) surface

Autor(en): Hirth, S
Ostendorf, F
Reichling, M 
Stichwörter: CAF2 111 SURFACE; CALCIUM-FLUORIDE; FORCE MICROSCOPY; Materials Science; Materials Science, Multidisciplinary; MOLECULES; Nanoscience & Nanotechnology; Physics; Physics, Applied; RESOLUTION; SCANNING TUNNELING MICROSCOPE; Science & Technology - Other Topics; SINGLE ATOMS; STM; TIP; WATER-ADSORPTION
Erscheinungsdatum: 2006
Herausgeber: IOP Publishing Ltd
Volumen: 17
Ausgabe: 7, SI
Startseite: S148-S154
Atomic scale manipulation on insulating surfaces is one of the great challenges of non-contact atomic force microscopy. Here we demonstrate lateral manipulation of defects occupying single ionic sites on a calcium fluoride (111)-surface. Defects stem from the interaction of the residual gas with the surface. The process of surface degradation is briefly discussed. Manipulation is performed over a wide range of path lengths ranging from tens of nanometres down to a few lattice constants. We introduce a simple manipulation protocol based on line-by-line scanning of a surface region containing defects to be manipulated, and record tip-surface distance and cantilever resonance frequency detuning as a function of the manipulation pathway in real time. We suggest a hopping model to describe manipulation where the tip-defect interaction is governed by repulsive forces.
8th International Conference on Non-Contact Atomic Force Microscopy, Bad Essen, GERMANY, AUG 15, 2005
ISSN: 09574484
DOI: 10.1088/0957-4484/17/7/S08

Show full item record

Page view(s)

Last Week
Last month
checked on Feb 22, 2024

Google ScholarTM