Atomic resolution Imaging on CeO2(111) with hydroxylated probes

DC FieldValueLanguage
dc.contributor.authorGritschneder, Sebastian
dc.contributor.authorReichling, Michael
dc.date.accessioned2021-12-23T16:03:35Z-
dc.date.available2021-12-23T16:03:35Z-
dc.date.issued2008
dc.identifier.issn19327447
dc.identifier.urihttps://osnascholar.ub.uni-osnabrueck.de/handle/unios/6077-
dc.description.abstractThe formation of atomic contrast on the stoichiometric CeO2(111) surface imaged by dynamic scanning force microscopy (SFM) operated in the noncontact mode (NC-AFM) is investigated. We reproducibly obtain two stable contrast patterns, namely a pattern of hexagonally ordered disk-like features and a honeycomb type structure. In series of measurements where we systematically vary the tip-surface, distance, we find at a large distance exclusively disk-like contrast while the honeycomb pattern occasionally appears at a small tip-surface distance. We explain the contrast features within a model assuming that both types of contrast are created by the attractive interaction of first and third layer surface oxygen ions with the terminating cluster of the tip. We propose a tip model involving single or vicinal hydroxyl groups at the apex of a silicon oxide tip. Within this model, the disk like contrast is produced by the most protruding hydroxyl group while the reversible change in contrast found for a small tip-surface distance is caused by its relaxation and possibly further hydroxyl groups contributing to the tip sample interaction.
dc.language.isoen
dc.publisherAMER CHEMICAL SOC
dc.relation.ispartofJOURNAL OF PHYSICAL CHEMISTRY C
dc.subjectCATALYSIS
dc.subjectCEO2
dc.subjectCERIA
dc.subjectChemistry
dc.subjectChemistry, Physical
dc.subjectMaterials Science
dc.subjectMaterials Science, Multidisciplinary
dc.subjectMODEL
dc.subjectNanoscience & Nanotechnology
dc.subjectSCANNING FORCE MICROSCOPY
dc.subjectScience & Technology - Other Topics
dc.subjectSURFACE
dc.titleAtomic resolution Imaging on CeO2(111) with hydroxylated probes
dc.typejournal article
dc.identifier.doi10.1021/jp076994y
dc.identifier.isiISI:000252968100050
dc.description.volume112
dc.description.issue6
dc.description.startpage2045
dc.description.endpage2049
dc.contributor.orcid0000-0003-3186-9000
dc.contributor.researcheridB-1123-2011
dc.publisher.place1155 16TH ST, NW, WASHINGTON, DC 20036 USA
dcterms.isPartOf.abbreviationJ. Phys. Chem. C
crisitem.author.deptFB 04 - Physik-
crisitem.author.deptidfb04-
crisitem.author.orcid0000-0003-3186-9000-
crisitem.author.parentorgUniversität Osnabrück-
crisitem.author.netidReMi818-
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