Real-space dynamical calculation of diffuse RHEED intensities from disordered surfaces

Autor(en): Meyer-Ehmsen, G
Stichwörter: APPARATUS; Chemistry; Chemistry, Physical; electron-solid interactions, scattering, diffraction; ENERGY ELECTRON-DIFFRACTION; faceting; growth; IMAGES; MICROSCOPY; molecular beam epitaxy; Physics; Physics, Condensed Matter; reflection electron microscopy; reflection high-energy electron diffraction; REM; RESOLUTION; SCATTERING; stepped single crystal surfaces; surface defects; surface structure, morphology, roughness, and topography; vicinal single crystal surfaces
Erscheinungsdatum: 1998
Herausgeber: ELSEVIER SCIENCE BV
Journal: SURFACE SCIENCE
Volumen: 395
Ausgabe: 1
Startseite: L189-L195
Zusammenfassung: 
Due to glancing incidence, reflection high-energy electron diffraction is very sensitive to surface imperfections along the incident beam azimuth. These show up in the diffraction patterns in the form of diffuse streaks through the diffraction spots. Tn many cases, the kinematic theory fails to describe the intensity distributions along the streaks because of multiple scattering (dynamic) effects. A new calculation scheme is described which allows relatively rapid dynamic intensity calculations for such types of disorder. The method uses finite difference methods to integrate the Schrodinger equation in real space in two dimensions, whereas periodicity along the surface perpendicular to the beam is assumed and treated by Fourier transformation. Approximate boundary conditions are used, the accuracy of which is checked. (C) 1998 Elsevier Science B.V.
ISSN: 00396028
DOI: 10.1016/S0039-6028(97)00788-7

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