NUMERICAL-ANALYSIS OF NORMAL REFLECTANCE DATA AS APPLIED TO THE STUDY OF OXIDE-FILMS ON COPPER

Autor(en): BARWINKEL, K
SCHMIDT, HJ
Stichwörter: Materials Science; Materials Science, Coatings & Films; Materials Science, Multidisciplinary; Physics; Physics, Applied; Physics, Condensed Matter
Erscheinungsdatum: 1979
Herausgeber: ELSEVIER SCIENCE SA LAUSANNE
Journal: THIN SOLID FILMS
Volumen: 59
Ausgabe: 3
Startseite: 373
Seitenende: 383
ISSN: 00406090
DOI: 10.1016/0040-6090(79)90447-4

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