ACCOMMODATION IN AR(KR, XE) AND METAL-SURFACE SYSTEMS AS A TEST FOR ELECTRONIC DISSIPATION

DC FieldValueLanguage
dc.contributor.authorBARWINKEL, K
dc.contributor.authorSCHIPPERS, S
dc.date.accessioned2021-12-23T16:05:10Z-
dc.date.available2021-12-23T16:05:10Z-
dc.date.issued1990
dc.identifier.issn0042207X
dc.identifier.urihttps://osnascholar.ub.uni-osnabrueck.de/handle/unios/6829-
dc.description11TH INTERNATIONAL VACUUM CONGRESS ( ICV-11 ) / 7TH INTERNATIONAL CONF ON SOLID SURFACES ( ICSS-7 ), COLOGNE, FED REP GER, SEP 25-29, 1989
dc.language.isoen
dc.publisherPERGAMON-ELSEVIER SCIENCE LTD
dc.relation.ispartofVACUUM
dc.subjectMaterials Science
dc.subjectMaterials Science, Multidisciplinary
dc.subjectPhysics
dc.subjectPhysics, Applied
dc.titleACCOMMODATION IN AR(KR, XE) AND METAL-SURFACE SYSTEMS AS A TEST FOR ELECTRONIC DISSIPATION
dc.typeconference paper
dc.identifier.doi10.1016/0042-207X(90)90369-A
dc.identifier.isiISI:A1990DR51600124
dc.description.volume41
dc.description.issue1-3
dc.description.startpage396
dc.description.endpage398
dc.contributor.orcid0000-0002-6166-7138
dc.contributor.orcid0000-0002-6166-7138
dc.contributor.researcheridAAY-3754-2021
dc.contributor.researcheridA-7786-2008
dc.publisher.placeTHE BOULEVARD, LANGFORD LANE, KIDLINGTON, OXFORD, ENGLAND OX5 1GB
dcterms.isPartOf.abbreviationVacuum
Show simple item record

Google ScholarTM

Check

Altmetric