Electron backscatter diffraction analysis applied to [001] magnetite thin films grown on MgO substrates
| Autor(en): | Koblischka-Veneva, Anjela Koblischka, Michael Rudolf Zhou, Y. Murphy, S. Mücklich, Frank Hartmann, Uwe Shvets, Igor V. |
Stichwörter: | Grain size; Electron backscatter diffraction; Electron diffraction; Materials science; Optics; Misorientation; Composite material; Physics; Thin film; Grain boundary; Magnetite; Diffraction; Metallurgy; Annealing (glass); Microstructure; Nanotechnology | Erscheinungsdatum: | 2007 | Herausgeber: | Elsevier BV | Journal: | Journal of Magnetism and Magnetic Materials | ISSN: | 0304-8853 | DOI: | https://doi.org/10.1016/j.jmmm.2007.03.199 |
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