Morphological and chemical characterization of thin heteroepitaxial praseodymium sesquioxide films on Si(111)

Autor(en): Schaefer, Andreas T.
Zielasek, Volkmar
Baeumer, Marcus
Schmidt, Thomas J.
Falta, Jens
Sandell, Anders
Wollschlaeger, Joachim 
Stichwörter: Sesquioxide; Chemistry; Mineralogy; Materials science; Metallurgy; Characterization (materials science); Nanotechnology; Praseodymium; Thin film
Erscheinungsdatum: 2008
Journal: Verhandlungen der Deutschen Physikalischen Gesellschaft
Volumen: 43
Ausgabe: 1
Externe URL: https://inis.iaea.org/search/search.aspx?orig_q=RN:40070596

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