An Immersive Feedback Framework for Scanning Probe Microscopy
| Autor(en): | Heitkamp, Denis Lorenz, Jaccomo Koall, Maximilian Rahe, Philipp Lensing, Philipp |
Stichwörter: | Computer science; Scanning ion-conductance microscopy; Microscopy; Scanning probe microscopy; Scanning confocal electron microscopy; Materials science; Optics; Computer graphics (images); Nanotechnology; Physics; Human–computer interaction | Erscheinungsdatum: | 2023 | DOI: | https://doi.org/10.5220/0011653400003417 |
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geprüft am 19.05.2024
