Atomic resolution force microscopy imaging on a strongly ionic surface with differently functionalized tips

Autor(en): Arai, T.
Gritschneder, S.
Troeger, L.
Reichling, M. 
Stichwörter: AFM; CAF2(111) SURFACE; CHEMICAL-IDENTIFICATION; Engineering; Engineering, Electrical & Electronic; GRAPHITE; IMAGES; Nanoscience & Nanotechnology; Physics; Physics, Applied; Science & Technology - Other Topics; SIZE DEFECTS; STEPS
Erscheinungsdatum: 2010
Herausgeber: A V S AMER INST PHYSICS
Journal: JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
Volumen: 28
Ausgabe: 6
Startseite: 1279
Seitenende: 1283
Zusammenfassung: 
Three types of tips for noncontact atomic force microscopy imaging, namely, a silicon nanopillar tip, a carbon nanopillar tip, and a fluoride cluster tip, are prepared for atomic resolution imaging on the CaF2(111) surface. The most enhanced atomic corrugation is obtained with the fluoride cluster tip prepared by gently touching the fluorite surface. Atom resolved images are much harder to obtain with the other tips. This demonstrates the importance of having a polar tip for atomic resolution imaging of an ionic surface and supports the general notion that a surface is best imaged with a tip of the same material. (C) 2010 American Vacuum Society. [DOI: 10.1116/1.3511505]
ISSN: 21662746
DOI: 10.1116/1.3511505

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