SKIPPING MOTION OF SI OFF CU(111)

DC FieldValueLanguage
dc.contributor.authorOCONNOR, DJ
dc.contributor.authorSNOWDON, KJ
dc.date.accessioned2021-12-23T16:07:23Z-
dc.date.available2021-12-23T16:07:23Z-
dc.date.issued1991
dc.identifier.issn0168583X
dc.identifier.urihttps://osnascholar.ub.uni-osnabrueck.de/handle/unios/7856-
dc.description8TH INTERNATIONAL WORKSHOP ON INELASTIC ION-SURFACE COLLISIONS, WIENER NEUSTADT, AUSTRIA, SEP 17-21, 1990
dc.description.abstractThe origin of a series of discrete peaks in the scattered ion spectra of Si scattered off a Cu(111) surface at glancing angles has been described by the authors as transient adsorption or skipping motion. Various experimental tests have been applied to the effect and subsurface channelling or other crystallographic effects have been eliminated as possible explanations [K.J. Snowdon, D.J. O'Connor and R.J. MacDonald, Phys. Rev. Lett. 61 (1988) 1760; Appl. Phys. A47 (1988) 83; Radiat. Eff. Defects Sol. 109 (1989) 25]. This leaves the trapping in the surface binding potential as the preferred model. Of the likely trapping mechanisms which could be responsible, one not seriously addressed so far is a kinetic process involving scattering from either steps on the surface or atoms experiencing extreme thermal displacements. These deflected projectiles could be trapped in a surface binding trajectory which results in an oscillatory path perpendicular to the surface.
dc.language.isoen
dc.publisherELSEVIER SCIENCE BV
dc.relation.ispartofNUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
dc.subjectInstruments & Instrumentation
dc.subjectIONS
dc.subjectNuclear Science & Technology
dc.subjectPhysics
dc.subjectPhysics, Atomic, Molecular & Chemical
dc.subjectPhysics, Nuclear
dc.subjectSURFACE SCATTERING
dc.subjectTRANSIENT ADSORPTION
dc.titleSKIPPING MOTION OF SI OFF CU(111)
dc.typeconference paper
dc.identifier.doi10.1016/0168-583X(91)95869-F
dc.identifier.isiISI:A1991FY47800012
dc.description.volume58
dc.description.issue3-4
dc.description.startpage360
dc.description.endpage364
dc.contributor.orcid0000-0003-4427-7733
dc.contributor.researcheridC-4336-2008
dc.publisher.placePO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS
dcterms.isPartOf.abbreviationNucl. Instrum. Methods Phys. Res. Sect. B-Beam Interact. Mater. Atoms
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