THICKNESS DEPENDENCE OF THE ELECTRONIC-STRUCTURE OF ULTRATHIN, EPITAXIAL NI(111)/W(110) LAYERS

DC FieldValueLanguage
dc.contributor.authorKAMPER, KP
dc.contributor.authorSCHMITT, W
dc.contributor.authorGUNTHERODT, G
dc.contributor.authorKUHLENBECK, H
dc.date.accessioned2021-12-23T16:07:52Z-
dc.date.available2021-12-23T16:07:52Z-
dc.date.issued1988
dc.identifier.issn01631829
dc.identifier.urihttps://osnascholar.ub.uni-osnabrueck.de/handle/unios/8107-
dc.language.isoen
dc.publisherAMERICAN PHYSICAL SOC
dc.relation.ispartofPHYSICAL REVIEW B
dc.subjectMaterials Science
dc.subjectMaterials Science, Multidisciplinary
dc.subjectPhysics
dc.subjectPhysics, Applied
dc.subjectPhysics, Condensed Matter
dc.titleTHICKNESS DEPENDENCE OF THE ELECTRONIC-STRUCTURE OF ULTRATHIN, EPITAXIAL NI(111)/W(110) LAYERS
dc.typejournal article
dc.identifier.doi10.1103/PhysRevB.38.9451
dc.identifier.isiISI:A1988Q924400011
dc.description.volume38
dc.description.issue14
dc.description.startpage9451
dc.description.endpage9456
dc.publisher.placeONE PHYSICS ELLIPSE, COLLEGE PK, MD 20740-3844 USA
dcterms.isPartOf.abbreviationPhys. Rev. B
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