Charge localization in collision-induced multiple ionization of van der Waals clusters with highly charged ions
Autor(en): | Tappe, W Flesch, R Ruhl, E Hoekstra, R Schlatholter, T |
Stichwörter: | ARGON CLUSTERS; C-60; ELECTRON-CAPTURE; EXCITATION; EXPLOSION; FRAGMENTATION; METAL-CLUSTERS; Physics; Physics, Multidisciplinary; SPECTROSCOPY | Erscheinungsdatum: | 2002 | Herausgeber: | AMERICAN PHYSICAL SOC | Journal: | PHYSICAL REVIEW LETTERS | Volumen: | 88 | Ausgabe: | 14 | Zusammenfassung: | Charge localization in multiple ionization and fragmentation of small argon clusters is reported. The processes are initiated by interaction of the neutral cluster with highly charged Xeq+ (5 less than or equal to q less than or equal to 25) Products are detected by means of multicoincidence time-of-flight methods. A strong dependence of the fragmentation pattern on the Xe charge state q is observed. In particular, we find evidence for formation of multiply charged atomic Arr+ fragment ions up to r = 7. Such high charge states have neither been observed in fission of multiply charged van der Waals clusters nor in ion-induced fragmentation of fullerenes or metal clusters. This hints at fundamentally different excitation and fragmentation dynamics. |
ISSN: | 00319007 | DOI: | 10.1103/PhysRevLett.88.143401 |
Zur Langanzeige
Seitenaufrufe
1
Letzte Woche
0
0
Letzter Monat
0
0
geprüft am 28.05.2024