Charge localization in collision-induced multiple ionization of van der Waals clusters with highly charged ions

Autor(en): Tappe, W
Flesch, R
Ruhl, E
Hoekstra, R
Schlatholter, T
Stichwörter: ARGON CLUSTERS; C-60; ELECTRON-CAPTURE; EXCITATION; EXPLOSION; FRAGMENTATION; METAL-CLUSTERS; Physics; Physics, Multidisciplinary; SPECTROSCOPY
Erscheinungsdatum: 2002
Herausgeber: AMERICAN PHYSICAL SOC
Journal: PHYSICAL REVIEW LETTERS
Volumen: 88
Ausgabe: 14
Zusammenfassung: 
Charge localization in multiple ionization and fragmentation of small argon clusters is reported. The processes are initiated by interaction of the neutral cluster with highly charged Xeq+ (5 less than or equal to q less than or equal to 25) Products are detected by means of multicoincidence time-of-flight methods. A strong dependence of the fragmentation pattern on the Xe charge state q is observed. In particular, we find evidence for formation of multiply charged atomic Arr+ fragment ions up to r = 7. Such high charge states have neither been observed in fission of multiply charged van der Waals clusters nor in ion-induced fragmentation of fullerenes or metal clusters. This hints at fundamentally different excitation and fragmentation dynamics.
ISSN: 00319007
DOI: 10.1103/PhysRevLett.88.143401

Show full item record

Page view(s)

1
Last Week
0
Last month
1
checked on Feb 23, 2024

Google ScholarTM

Check

Altmetric