Pressure dependence of thickness and refractive index of thin PMMA-films investigated by surface plasmon and optical waveguide spectroscopy

DC FieldValueLanguage
dc.contributor.authorKleideiter, G
dc.contributor.authorLechner, MD
dc.contributor.authorKnoll, W
dc.date.accessioned2021-12-23T16:07:59Z-
dc.date.available2021-12-23T16:07:59Z-
dc.date.issued1999
dc.identifier.issn10221352
dc.identifier.urihttps://osnascholar.ub.uni-osnabrueck.de/handle/unios/8165-
dc.description.abstractTotal internal reflection (TIR) and attenuated total reflection (ATR) measurements in the Kretschmann configuration have been performed at 25 degrees C with poly(methyl methacrylate) (PMMA) films (of ca. 2.5 mu m thickness) spincoated on top of a 50 nm thick gold layer, as a function of the applied hydrostatic pressure, ranging from p = I . 10(5) to 1050 . 10(5) Pa. The analysis of guided optical modes allows for the separate determination of the refractive index n and the thickness d of the polymer films as a function of pressure. The pressure media in contact with the PMMA films were water, ethanol, and methanol. Thermodynamic theories for the density of solids and fluids in combination with the Lorentz-Lorenz equation for their optical properties fit the experimental data quite well.
dc.language.isoen
dc.publisherWILEY-V C H VERLAG GMBH
dc.relation.ispartofMACROMOLECULAR CHEMISTRY AND PHYSICS
dc.subjectGLASS
dc.subjectPolymer Science
dc.titlePressure dependence of thickness and refractive index of thin PMMA-films investigated by surface plasmon and optical waveguide spectroscopy
dc.typejournal article
dc.identifier.doi10.1002/(SICI)1521-3935(19990501)200:5<1028::AID-MACP1028>3.0.CO;2-8
dc.identifier.isiISI:000080208500013
dc.description.volume200
dc.description.issue5
dc.description.startpage1028
dc.description.endpage1033
dc.publisher.placeMUHLENSTRASSE 33-34, D-13187 BERLIN, GERMANY
dcterms.isPartOf.abbreviationMacromol. Chem. Phys.
Show simple item record

Page view(s)

3
Last Week
0
Last month
0
checked on Apr 23, 2024

Google ScholarTM

Check

Altmetric