Probing of magnetic surfaces with inherent monolayer sensitivity by ion scattering

Autor(en): Narmann, A
Dirska, M
Manske, J
Schleberger, M
Stichwörter: 2ND-HARMONIC GENERATION; ATOMS; CAPTURE; ELECTRONS; FE(110); FILMS; Instruments & Instrumentation; INTERFACE; ion-solid interactions; iron; low energy ion scattering; magnetic measurements; magnetic phenomena; magnetic surfaces; Nuclear Science & Technology; Physics; Physics, Atomic, Molecular & Chemical; Physics, Nuclear; POLARIZED-LIGHT EMISSION; SLOW; SOLIDS
Erscheinungsdatum: 1998
Herausgeber: ELSEVIER SCIENCE BV
Journal: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
Volumen: 136
Startseite: 1212
Seitenende: 1217
Zusammenfassung: 
When ions scatter off surfaces, some particles are neutralized into excited states that are subsequently de-excited by light emission. In case of magnetic surfaces the information about the spin of the captured electron might be accessed via the polarization of the emitted light. In the grazing incidence mode, the surface sensitivity is highest due to the fact that the particles do not penetrate into the target surface but are scattered well above the uppermost atomic layer. Thus the electrons that neutralize the incoming ion originate from the topmost layer. This implies that the method is very well suited to investigate the properties of magnetic surfaces and multilayer structures. We present data that show the inherent surface sensitivity of this method, By properly choosing the experimental parameters one also assures that the energy deposited by the projectiles in the surface is negligible as well as the number of sputtered particles. We also present the first hysteresis curves recorded with this method, thereby showing that the measured signal follows the magnetic state of the surface, In combination with its surface sensitivity this shows that ion beam scattering is very well suited to investigate not only the surfaces of magnetic materials but also (ultra-)thin films and multilayer systems. (C) 1998 Elsevier Science B.V.
Beschreibung: 
13th International Conference on Ion Beam Analysis (IBA-13), LISBON, PORTUGAL, JUL 27-AUG 01, 1997
ISSN: 0168583X
DOI: 10.1016/S0168-583X(97)00814-8

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