Holographic recording in planar Cu : H : LiTaO3 waveguides

DC FieldValueLanguage
dc.contributor.authorKostritskii, SM
dc.contributor.authorKip, D
dc.date.accessioned2021-12-23T16:09:41Z-
dc.date.available2021-12-23T16:09:41Z-
dc.date.issued1998
dc.identifier.issn00318965
dc.identifier.urihttps://osnascholar.ub.uni-osnabrueck.de/handle/unios/8937-
dc.description.abstractPhotorefractive planar waveguides in LiTaO3 are fabricated by a proton exchange and a successive copper exchange from melts, containing either Cu+ or Cu2+ ions. The influence of different fabrication steps on refractive index profiles, hydrogen content, optical absorption, and waveguide transparency is investigated. With holographic methods dark and photoconductivity, holographic sensitivity, and light-induced refractive index change are measured. By the additional copper exchange the steady-state diffraction efficiency of holographic gratings in the waveguides is increased from 0.005 to 81%. Here the crucial influence of both, Cu valence state and hydrogen concentration on the holographic sensitivity is demonstrated.
dc.language.isoen
dc.publisherWILEY-V C H VERLAG GMBH
dc.relation.ispartofPHYSICA STATUS SOLIDI A-APPLIED RESEARCH
dc.subjectLITAO3
dc.subjectLITHIUM TANTALATE
dc.subjectMaterials Science
dc.subjectMaterials Science, Multidisciplinary
dc.subjectPhysics
dc.subjectPhysics, Applied
dc.subjectPhysics, Condensed Matter
dc.subjectPROTON
dc.subjectWAVE-GUIDES
dc.titleHolographic recording in planar Cu : H : LiTaO3 waveguides
dc.typejournal article
dc.identifier.doi10.1002/(SICI)1521-396X(199809)169:1<171::AID-PSSA171>3.3.CO;2-L
dc.identifier.isiISI:000076351300026
dc.description.volume169
dc.description.issue1
dc.description.startpage171
dc.description.endpage180
dc.contributor.orcid0000-0001-7923-0113
dc.contributor.researcheridC-7021-2013
dc.publisher.placeMUHLENSTRASSE 33-34, D-13187 BERLIN, GERMANY
dcterms.isPartOf.abbreviationPhys. Status Solidi A-Appl. Res.
Show simple item record

Page view(s)

2
Last Week
0
Last month
0
checked on Apr 13, 2024

Google ScholarTM

Check

Altmetric