Spectroscopy of positively and negatively buckled domains on Si(111)-2x1

DC FieldValueLanguage
dc.contributor.authorLoeser, K.
dc.contributor.authorWenderoth, M.
dc.contributor.authorSpaeth, T. K. A.
dc.contributor.authorGarleff, J. K.
dc.contributor.authorUlbrich, R. G.
dc.contributor.authorPoetter, M.
dc.contributor.authorRohlfing, M.
dc.date.accessioned2021-12-23T16:10:16Z-
dc.date.available2021-12-23T16:10:16Z-
dc.date.issued2012
dc.identifier.issn24699950
dc.identifier.urihttps://osnascholar.ub.uni-osnabrueck.de/handle/unios/9251-
dc.description.abstractThe influence of the buckling type of the Si(111)-2 x 1 surface on the electronic structure is studied with high-resolution scanning tunneling microscopy and scanning tunneling spectroscopy and compared to ab initio calculations. We utilize the multitude of domain boundaries to identify differently buckled domains. I (V) measurements with high spatial and energetic resolution show the electronic structures of the two buckling types. We determine the position of the surface bands in the band gap of the bulk silicon and relative to each other. The high spatial resolution provides insight into the crossover from one buckling type to the other at the domain boundaries.
dc.description.sponsorshipDFGGerman Research Foundation (DFG)European Commission [WE 1889/3]; We acknowledge financial support by the DFG via Project No. WE 1889/3.
dc.language.isoen
dc.publisherAMER PHYSICAL SOC
dc.relation.ispartofPHYSICAL REVIEW B
dc.subjectELECTRONIC-STRUCTURE
dc.subjectMaterials Science
dc.subjectMaterials Science, Multidisciplinary
dc.subjectMODEL
dc.subjectPhysics
dc.subjectPhysics, Applied
dc.subjectPhysics, Condensed Matter
dc.subjectSURFACE
dc.titleSpectroscopy of positively and negatively buckled domains on Si(111)-2x1
dc.typejournal article
dc.identifier.doi10.1103/PhysRevB.86.085303
dc.identifier.isiISI:000307273800004
dc.description.volume86
dc.description.issue8
dc.contributor.researcheridQ-3966-2016
dc.identifier.eissn24699969
dc.publisher.placeONE PHYSICS ELLIPSE, COLLEGE PK, MD 20740-3844 USA
dcterms.isPartOf.abbreviationPhys. Rev. B
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